Plate defect mitigation techniques

ABSTRACT

Methods, systems, techniques, and devices for operating a ferroelectric memory cell or cells are described. Groups of cells may be operated in different ways depending, for example, on a relationship between cell plates of the group of cells. Cells may be selected in pairs in order to accommodate an electric current relationship, such as a short, between cells that make up the pair. Cells may be arranged in cell plate groups, and a pair of cells may include a first cell plate from one cell plate group and a second cell plate from the same cell plate group or from another, adjacent cell plate group. So a pair of cell plates may include cell plates from different cell plate groups. The first and second cell plates may be selected as a pair or a group based at least in part on the electric current relationship between the cell plates.

CROSS REFERENCE

The present application for patent is a continuation of U.S. patentapplication Ser. No. 15/184,795 by Fackenthal et al., entitled “PLATEDEFECT MITIGATION TECHNIQUES,” filed Jun. 16, 2016, assigned to theassignee hereof, and is expressly incorporated by reference in itsentirety herein.

BACKGROUND

The following relates generally to memory devices and more specificallyto selection of and operations relating to cell plates.

Memory devices are widely used to store information in variouselectronic devices such as computers, wireless communication devices,cameras, digital displays, and the like. Information is stored byprogramming different states of a memory device. For example, binarydevices have two states, often denoted by a logic “1” or a logic “0.” Inother systems, more than two states may be stored. To access the storedinformation, the electronic device may read, or sense, the stored statein the memory device. To store information, the electronic device maywrite, or program, the state in the memory device.

Various types of memory devices exist, including random access memory(RAM), read only memory (ROM), dynamic RAM (DRAM), synchronous dynamicRAM (SDRAM), ferroelectric RAM (FeRAM), magnetic RAM (MRAM), resistiveRAM (RRAM), flash memory, and others. Memory devices may be volatile ornon-volatile. Non-volatile memory (e.g., flash memory), may store datafor extended periods of time even in the absence of an external powersource. Volatile memory devices (e.g., DRAM), may lose their storedstate over time unless they are periodically refreshed by an externalpower source. A binary memory device may, for example, include a chargedor discharged capacitor. A charged capacitor may become discharged overtime through leakage currents, resulting in the loss of the storedinformation. Certain aspects of volatile memory may offer performanceadvantages, such as faster read or write speeds, while aspects ofnon-volatile, such as the ability to store data without periodicrefreshing, may be advantageous.

FeRAM may use similar device architectures as volatile memory but mayhave non-volatile properties due to the use of a ferroelectric capacitoras a storage device. FeRAM devices may thus have improved performancecompared to other non-volatile and volatile memory devices. In certainFeRAM designs (among other design types), vertically cut cell plates,among other components, may include one or more non-ideal or undesirablerelationships or communications that renders the cell plates, otherelements, and/or other components unusable and potentially requirenumerous redundant and expensive memory elements.

BRIEF DESCRIPTION OF THE DRAWINGS

Example embodiments of the present disclosure are described withreference to the following figures:

FIG. 1 illustrates an example memory array that supports selection ofand operations based on one or more cell plates in accordance withvarious embodiments of the present disclosure;

FIG. 2 illustrates an example circuit of a memory cell that supportsselection of and operations relating to one or more cell plates inaccordance with various embodiments of the present disclosure;

FIG. 3 illustrates example hysteresis curves for a ferroelectric memorycell that supports selection of and operations relating to one or morecell plates in accordance with various embodiments of the presentdisclosure;

FIG. 4 illustrates an example of a memory array and other componentsthat support selection of and operations relating to one or more cellplates in accordance with various embodiments of the present disclosure;

FIG. 5 illustrates an example of a memory array and other componentsthat support selection of and operations relating to one or more cellplates in accordance with various embodiments of the present disclosure;

FIG. 6 illustrates exemplary memory arrays and relationships ofcomponents that support selection of and operations relating to one ormore cell plates in accordance with various embodiments of the presentdisclosure;

FIG. 7 illustrates a memory array that supports selection of andoperations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure;

FIG. 8 illustrates a system, including a memory array, that supportsselection of and operations relating to one or more cell plates inaccordance with various embodiments of the present disclosure; and

FIGS. 9 and 10 are flowcharts that illustrate methods for selection ofand operations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure.

DETAILED DESCRIPTION

In memory designs, when long traces or continuous portions of memoryelements are printed, the risk of unintentional defects increases. Thesedefects may create operational problems and may render parts of or wholememory arrays unusable. In some array designs, cell plates and otherelements are close together, and there is a risk of unintentionalcurrent and other relationships between cell plates, including, but notlimited to, adjacent cell plates. Based on manufacturing or otheractions, cell plates may have a current relationship with or otherdefects relative to neighboring cell plates. Such relationships ordefect may weaken or prohibit performance of one or more of the cellplates. Examples of such, relationships include shorts, parasitic fieldsor signals, and the like.

Some cell plates may include vertically-cut cell plates, among others,that may be common among a small number of digit lines (e.g., 4 to 16)and a relatively large number of word lines (e.g., 512 to 1024). Themanner in which cell plates are formed during manufacturing may affectarray performance. In some instances, because the distance betweenrespective cell plates is relatively narrow (e.g., like the distancesbetween digits lines, word lines) then an electric current relationshipmay exist between the cell plates. In some embodiments, a currentrelationship (e.g., a short) between cell plates of a group may renderthe group, the section, or some other memory elements inoperative. Insome cases, the risk of shorting between cells may cause manufacturersto employ expensive wholesale or local redundancies, or both; and therisk of such deficiencies may promote other, relatively complexsolutions, include more robust design parameters (e.g., increasingspacing between plates). These alternatives increase costs and decreasememory design functions and capabilities.

As described herein, memory arrays may be created and operated tomitigate risk of defects. By way of example, based on one or morecurrent relationships between various cell plates (among otherelements), two plates may be selected together to permit operation andpopulate one or more sensing components despite the current relationship(e.g., a short) existing between the plates that would otherwise renderthe plates or other elements (e.g., the section) inoperable. In someembodiments, this selection may be based at least in part on selectingtwo plates at the same time. In some embodiments, this selection may bebased on selecting two plates concurrently. In some embodiments, thisselection may be based on selecting one pair of plates that include anelectrical current relationship. In some embodiments, this selection maybe based on selecting one pair of plates that do not themselves includean electrical current relationship, but that spatially or otherwiserelate to the plates having the electrical current relationship.

In some embodiments, the cell plates selected in one or more cell plategroups (e.g., groups of eight cell plates) may be selected based on arelative position to each other or other elements or components. Forexample, and as described further below, if a cell plate in the zeroposition (e.g., first position in a group) and a cell plate in the oneposition (e.g., second position in a group) have an electrical currentrelationship (e.g., a short exists between plates), then the cell platesin this group or in other groups may be selected or paired togetherusing an “even-odd” relationship, which corresponds to theposition-based zero-one relationship. As another example, if a cellplate in the three position (e.g., in the fourth position in the group)and the cell plate in the fourth position (e.g., the fifth position inthe group) have an adverse current relationship (e.g., a predeterminedcurrent level exists), then the cell plates in this group and/or inother groups may all be selected or paired together using an “odd-even”relationship, which corresponds to the position-based three-fourrelationship.

In some embodiments, by selecting cell plates in corresponding pairs,the corresponding selection components (e.g., transistors) are arrangedto enable a first set of cell plates (e.g., plates 0, 2, 4, and 6) to beconnected to designated sense components (e.g., sense amps) usingcorresponding digit lines and a second set of cell plates (e.g., plates1, 3, 5, and 7) to be connected to designated sense components (e.g.,sense amps) using corresponding digit lines. In this way, when anadjacent pair or pairs of plates are selected, the designated sensecomponents corresponding to the eight plates may each be correctlypopulated with data—despite one or more electrical current relationshipsbetween, for example, the plates, elements or components. As discussedfurther below, in some embodiments, this selection of plates and thecorresponding correctly-populated sense components may be based on sevenplates from a first cell plate group (e.g., plates 0 through 6, plates 1through seven) and one plate from a second cell plate group (e.g., plate7, plate 0), providing eight correctly populated sense components.

Embodiments of the disclosure introduced above are further describedbelow in the context of a memory array, and in other contexts. Specificembodiments are then described for cell plates, including vertically cutcell plates and the selection of cell plates and related operations,among others. These and other embodiments of the disclosure are furtherillustrated by and described with reference to apparatus diagrams,system diagrams, and flowcharts that relate to selection of andoperations based at least in part on one or more groups of cell plates.

In the present disclosure, a cell plates and a plate are usedsynonymously, unless the specific embodiment or embodiments indicatesotherwise.

FIG. 1 illustrates an example memory array 100 that supports selectionof and operations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure. Memory array 100 may alsobe referred to as an electronic memory apparatus. Memory array 100includes memory cells 105 that are programmable to store differentstates. Each memory cell 105 may be programmable to store two states,denoted as a logic 0 and a logic 1. In some embodiments, memory cell 105is configured to store more than two logic states. Each state mayproduce a corresponding voltage across a memory cell 105 when the memorycell 105 is accessed. A memory cell 105 may include a capacitor to storea charge representative of the programmable states; for example, acharged and uncharged capacitor may represent two logic states. DRAMarchitectures may commonly use such a design, and the capacitor employedmay include a dielectric material with linear electric polarizationproperties. By contrast, a ferroelectric memory cell may include acapacitor that has a ferroelectric as the dielectric material. Differentlevels of charge of a ferroelectric capacitor may represent differentlogic states. Ferroelectric materials have non-linear polarizationproperties, and details and advantages of a ferroelectric memory cell105 are discussed below.

Operations such as reading and writing may be performed on memory cells105 by activating or selecting the appropriate word line 110 and digitline 115. Activating or selecting a word line 110 or a digit line 115may include applying a voltage to the respective line. In someembodiments, a digit line 115 may be referred to as a bit line. Wordlines 110 or digit lines 115, or both, may be referred to as accesslines. Word lines 110 and digit lines 115 may be made of conductivematerials. In some embodiments, word lines 110 and digit lines 115 aremade of metals (e.g., copper, aluminum, gold, tungsten, etc.). Each rowof memory cells 105 is connected to a single word line 110, and eachcolumn of memory cells 105 is connected to a single digit line 115.

By activating one word line 110 and one digit line 115, a single memorycell 105 may be accessed at their intersection. The intersection of aword line 110 and digit line 115 may be referred to as an address of amemory cell. In some embodiments, each digit line 115 may be connectedto one or more sense components 125, which in some embodiments mayinclude a sense amp, corresponding to each digit line 115. In someembodiments, one or more read or write operations may be based on orderived from one or more selections of cell plates. For example,selections of one or several cell plates may dictate a plate pairbetween two cell plates or a plate pairing for each set (e.g., a set oftwo cell plates) within one or more groups, sections, banks, dies, etc.

In some architectures, the logic storing device of a cell, e.g., acapacitor, may be electrically isolated from the digit line by aselection device. The word line 110 may be connected to and may controlthe selection device. For example, the selection device may be atransistor and the word line 110 may be connected to the gate of thetransistor. Activating the word line 110 results in an electricalconnection between the capacitor of a memory cell 105 and itscorresponding digit line 115. The digit line may then be accessed toeither read or write the memory cell 105.

Accessing memory cells 105 may be controlled through a row decoder 120and a column decoder 130. For example, a row decoder 120 may receive arow address from the memory controller 140 and activate the appropriateword line 110 based on the received row address. Similarly, a columndecoder 130 receives a column address from the memory controller 140 andactivates the appropriate digit line 115. Thus, by activating a wordline 110 and a digit line 115, a memory cell 105 may be accessed. Asdiscussed herein, in various embodiments, the address or location of oneor more cells or cell plates may affect identifications, determinations,or selections related to cell plates, among other elements orcomponents. In some embodiments, the address or the location of memorycells may affect a selection, such as a selection based on an absoluteaddress or location or a relative address or location. In someembodiments, the address or the location of a memory cell and theexistence of an electric current relationship may affect a selection ofplate pairs, in cell plate group or across cell plate groups.

Upon accessing, a memory cell 105 may be read, or sensed, by sensecomponent 125. When a memory cell 105 is read, the stored state mayproduce a corresponding signal across a capacitor of the cell, and thusat the digit line 115. For example, sense component 125 may compare asignal, e.g., a voltage, of the relevant digit line 115 to a referencesignal (not shown) in order to determine the stored state of the memorycell 105. For example, if digit line 115 has a higher voltage than thereference voltage, then sense component 125 may determine that thestored state in memory cell 105 was a logic 1 and vice versa. Sensecomponent 125 may include various transistors or amplifiers in order todetect and amplify a difference in the signals, which may be referred toas latching. The detected logic state of memory cell 105 may then beoutput through column decoder 130 as output 135.

A memory cell 105 may be set, or written or initialized to a state, bysimilarly activating the relevant word line 110 and digit line 115. Asdiscussed above, activating a word line 110 electrically connects thecorresponding row of memory cells 105 to their respective digit lines115. By controlling the relevant digit line 115 while the word line 110is activated, a memory cell 105 may be written—i.e., a logic value maybe stored in the memory cell 105. Column decoder 130 may accept data,for example input 135, to be written to the memory cells 105. In thecase of a ferroelectric capacitor, a memory cell 105 is written byapplying a voltage across the ferroelectric capacitor. This process isdiscussed in more detail below.

In some memory architectures, accessing the memory cell 105 may degradeor destroy the stored logic state and re-write or refresh operations maybe performed to return the original logic state to memory cell 105. InDRAM, for example, the capacitor may be partially or completelydischarged during a sense operation, among others, corrupting the storedlogic state. So the logic state may be re-written after a senseoperation. Additionally, activating a single word line 110 may result inthe discharge of one or more memory cells in the row; thus, one or morememory cells 105 in the row may need to be re-written.

Some memory architectures, including DRAM, may lose their stored stateover time unless they are periodically refreshed by an external powersource. For example, a charged capacitor may become discharged over timethrough leakage currents, resulting in the loss of the storedinformation. The refresh rate of these so-called volatile memory devicesmay be relatively high (e.g., tens of refresh operations per second forDRAM), which may result in significant power consumption. Withincreasingly larger memory arrays, increased power consumption mayinhibit the deployment or operation of memory arrays (e.g., powersupplies, heat generation, material limits, etc.), especially for mobiledevices that rely on a finite power source, such as a battery. Asdiscussed below, ferroelectric memory cells may have beneficialproperties that may result in improved performance relative to othermemory architectures. For example, because ferroelectric memory cellstend to be less susceptible to degradation of stored charge, a memoryarray 100 that employs ferroelectric memory cells 105 may require feweror no refresh operations, and may thus require less power to operate.

The memory controller 140 may control the operation (read, write,re-write, refresh, etc.) of memory cells 105 through the variouscomponents, for example, row decoder 120, column decoder 130, and sensecomponent 125. Memory controller 140 may generate row and column addresssignals in order to activate the desired word line 110 and digit line115. Memory controller 140 may also generate and control various voltagepotentials used during the operation of memory array 100. In general,the amplitude, shape, or duration of an applied voltage discussed hereinmay be adjusted or varied and may be different for the variousoperations discussed in operating memory array 100. Furthermore, one,multiple, or all memory cells 105 within memory array 100 may beaccessed simultaneously; for example, multiple or all cells of memoryarray 100 may be accessed simultaneously during a reset operation inwhich all memory cells 105, or a group of memory cells 105, are set to asingle logic state.

In some embodiments, memory controller 140 may be related to or inelectronic communication with a first cell plate and a second cellplate. A first digit line may be in electronic communication with thefirst cell plate and a first sense component (e.g., a sense amp) via afirst selection component (e.g., a transistor). A second digit line mayalso be in electronic communication with the second cell plate and asecond sense component (e.g., a sense amp) via a second selectioncomponent (e.g., a transistor). Based at least in part on the electroniccommunication, the controller may be operable to initiate or perform oneor more operations relating to selecting one or more cell plate pairs.In some embodiments, the memory controller 140 may be operable todetermine an electric current relationship relating to one or more cellplates. Based at least in part on this determining or identifying, thememory controller 140 may initiate (e.g., send an instruction or asignal to, or control another element or component to operate to) andoperate to select the first cell plate and the second cell plate usingthe first selection component or the second selection component. Thisselection may, in some embodiments, include an electronic communicationfrom the controller to the one or more selection components.

FIG. 2 illustrates an example circuit 200 that supports selection of andoperations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure. Circuit 200 may include aferroelectric memory cell 105-a, a word line 110-a, a digit line 115-a,and a sense component 125-a, which may be embodiments of a memory cell105, a word line 110, a digit line 115, and a sense component 125,respectively, as described with reference to FIG. 1 and/or others.Circuit 200 includes a logic storage component, such as capacitor 205,which may include conductive terminals, including plate 210 and cellbottom 215. These terminals may be separated by an insulatingferroelectric material. As described in the present disclosure, variousstates may be stored by charging or discharging capacitor 205.

The stored state of capacitor 205 may be read or sensed by operatingvarious elements represented in circuit 200. Capacitor 205 may be inelectronic communication with digit line 115-a. Capacitor 205 may thusbe isolated from the digit line 115-a when selection component 220 isdeactivated, and capacitor 205 may be connected to digit line 115-a viaselection component 220 when selection component 220 is activated toselect the ferroelectric memory cell 105-a. In other words,ferroelectric memory cell 105-a may be selected using selectioncomponent 220 that is in electronic communication with ferroelectriccapacitor 205, where ferroelectric memory cell 105-a includes selectioncomponent 220 and ferroelectric capacitor 205. In some embodiments,selection component 220 may be or include a transistor and its operationmay be controlled by applying a voltage to a transistor gate, where thevoltage has a magnitude greater than the threshold magnitude of thetransistor. Word line 110-a may activate selection component 220; forexample, a voltage applied to word line 110-a may be applied to thetransistor gate, connecting capacitor 205 with digit line 115-a.

In the example depicted in FIG. 2, capacitor 205 is a ferroelectriccapacitor. Due to the ferroelectric material between the plates ofcapacitor 205, and as discussed in more detail below, capacitor 205 maynot discharge upon connection to digit line 115-a. Instead, plate 210may be biased by an external voltage, resulting in a change in thestored charge on capacitor 205. The change in stored charge correspondsto and/or depends on an initial logic state of capacitor 205. A voltageapplied to capacitor 205 changes the charge of capacitor 205. The changein charge may be compared to a reference 225 (e.g., a reference voltage)by sense component 125-a in order to determine the stored logic state inmemory cell 105-a.

The specific sensing scheme or process may take many forms. In oneexample, digit line 115-a may have an intrinsic capacitance and developa non-zero voltage as capacitor 205 charges or discharges in response tothe voltage applied to plate 210. The intrinsic capacitance may dependon physical characteristics, including the dimensions, of digit line115-a, among others. Digit line 115-a may connect many memory cells 105so digit line 115-a may have a length that results in a non-negligiblecapacitance (e.g., on the order of pF or fF). The subsequent voltage ofdigit line 115-a may depend on the initial logic state of capacitor 205,and sense component 125-a may compare this voltage to a referencevoltage, which may include a reference voltage generated by other memorycells 105. For example, a voltage may be applied to plate 210 and avoltage at capacitor bottom 215 may change in relation to the storedcharge. The voltage at capacitor bottom 215 may be compared with areference voltage at sense component 125-a, and a comparison to thereference voltage may indicate a change in the charge of capacitor 205resulting from the applied voltage and thus indicate a logic statestored in memory cell 105-a. The relationship between charge and voltagein capacitor 205 is described in further detail with reference to FIG.3, among others.

Other sensing processes may be used. For example, two or more sensecomponents 125-a may each sense the voltage or other characteristics attwo or more digit lines 115-a that each correspond to one or more plates210. In some embodiments, when the two or more plates 210 includeadjacent plates 210, these plates 210 may be selected together and thevalue sensed by each sense component 125-a (e.g., a sense amp) may becorrectly read or monitored so that the eight sense components 125-acorresponding to a plate group (or parts of two plates groups) are eachcorrectly populated with data. In some embodiments, each of four sensecomponents 125-a is populated based on one of four digit lines 115-acorresponding to a first cell plate 210 and each of four sense amps ispopulated based on one of four digit lines corresponding to a secondcell plate 210. By using the selection and shifting techniques andmethods of the present disclosure and selecting two cell plates 210together the eight sense components (e.g., sense amps) may be correctlypopulated regardless of any electric current relationship relating to orbetween two cell plates 210 and/or one or more other defects or adverseconditions relating to the two cell plates 210 or other elements orcomponents.

To write memory cell 105-a, a voltage may be applied across capacitor205. Various methods may be used. In one example, selection component220 may be activated through word line 110-a in order to electricallyconnect capacitor 205 to digit line 115-a. A voltage may be appliedacross capacitor 205 by controlling the voltage of cell plate 230 usingplate line 210 and controlling the voltage of cell bottom 215 usingdigit line 115-a. To write a logic “0,” cell plate 230 may be takenhigh, that is, a positive voltage may be applied to plate line 210, andcell bottom 215 may be taken low—e.g., virtually grounded using digitline 115-a. The opposite process is performed to write a logic “1”,i.e., cell plate 230 may be taken low and cell bottom 215 may be takenhigh. Read and write operations of capacitor 205 may account for thenon-linear properties associated with a ferroelectric device.

FIG. 3 illustrates example hysteresis curves 300 for a ferroelectricmemory cell that supports selection of and operations relating to one ormore cell plates in accordance with various embodiments of the presentdisclosure. Hysteresis curves 300-a and 300-b illustrate an exampleferroelectric memory cell writing and reading process, respectively.Hysteresis curves 300 depict the charge, Q, stored on a ferroelectriccapacitor (e.g., capacitor 205 of FIG. 2) as a function of a voltagedifference, V.

A ferroelectric material is characterized by a spontaneous electricpolarization, i.e., it maintains a non-zero electric polarization in theabsence of an electric field. Example ferroelectric materials includebarium titanate (BaTiO₃), lead titanate (PbTiO₃), lead zirconiumtitanate (PZT), and strontium bismuth tantalate (SBT). The ferroelectriccapacitors described herein may include these or other ferroelectricmaterials. Electric polarization within a ferroelectric capacitorresults in a net charge at the ferroelectric material's surface andattracts opposite charge through the capacitor terminals. Thus, chargemay be stored at the interface of the ferroelectric material and thecapacitor terminals. Because the electric polarization may be maintainedin the absence of an externally applied electric field for relativelylong times, even indefinitely, charge leakage may be significantlydecreased as compared with, for example, capacitors employed in DRAMarrays. This may reduce the need to perform refresh operations asdescribed above for some architectures.

Hysteresis curves 300 may be understood from the perspective of a singleterminal of a capacitor. By way of example, if the ferroelectricmaterial has a negative polarization, positive charge may accumulate atthe terminal. Likewise, if the ferroelectric material has a positivepolarization, negative charge may accumulate at the terminal.Additionally, the voltages in hysteresis curves 300 represent a voltagedifference across the capacitor and are directional. For example, apositive voltage may be applied by applying a positive voltage to theterminal in question and maintaining the second terminal at a referencevoltage, the may be ground (e.g., approximately zero volts (0V)). Anegative voltage may be applied by maintaining the terminal in questionat ground and applying a positive voltage to the second terminal, i.e.,positive voltages may be applied to negatively polarize the terminal inquestion. Similarly, two positive voltages, two negative voltages, or acombination of positive and negative voltages may be applied to theappropriate capacitor terminals to generate the voltage difference shownin hysteresis curves 300.

As depicted in hysteresis curve 300-a, the ferroelectric material maymaintain a positive or negative polarization with a zero voltagedifference, resulting in two possible charged states: charge state 305and charge state 310. According to the example of FIG. 3, charge state305 represents a logic 0 and charge state 310 represents a logic 1. Insome embodiments, the logic values of the respective charge states maybe reversed to accommodate other schemes for operating a memory cell.

A logic 0 or 1 may be written to the memory cell by controlling theelectric polarization of the ferroelectric material, and thus the chargeon the capacitor terminals, by applying voltage. For example, applying anet positive voltage 315 across the capacitor results in chargeaccumulation until charge state 305-a is reached. Upon removing positivevoltage 315, charge state 305-a follows path 320 until it reaches chargestate 305 at zero voltage potential. Similarly, charge state 310 iswritten by applying a net negative voltage 325, which results in chargestate 310-a. After removing negative voltage 325, charge state 310-afollows path 330 until it reaches charge state 310 at zero voltage.Charge states 305-a and 310-a may also be referred to as the remnantpolarization (Pr) values, i.e., the polarization (or charge) thatremains upon removing the external bias (e.g., voltage). The coercivevoltage is the voltage at which the charge (or polarization) is zero.

To read, or sense, the stored state of the ferroelectric capacitor, avoltage may be applied across the capacitor. In response, the storedcharge changes, and the degree of the change depends on the initialcharge state—i.e., the degree to which the stored charge of thecapacitor changes varies depends on whether charge state 305-b or 310-bwas initially stored. For example, hysteresis curve 300-b illustratestwo possible stored charge states 305-b and 310-b. Net voltage 335 maybe applied across the capacitor. Although depicted as a positivevoltage, voltage 335 may be negative. In response to voltage 335, chargestate 305-b may follow path 340. Likewise, if charge state 310-b wasinitially stored, then it follows path 345. The final position of chargestate 305-c and charge state 310-c depend on a number of factors,including the specific sensing operation and circuitry.

In some embodiments, the charge sensed during a read operation maydepend on the intrinsic capacitance of the digit line of a memory cell.For example, if a ferroelectric capacitor of the memory cell iselectrically connected to the digit line and voltage 335 is applied, thevoltage of the digit line may rise due to its intrinsic capacitance. Soa voltage measured at a sense component may not equal voltage 335 andinstead may depend on the voltage of the digit line. The position offinal charge states 305-c and 310-c on hysteresis curve 300-b may thusdepend on the capacitance of the digit line and may be determinedthrough a load-line analysis, i.e., charge states 305-c and 310-c may bedefined with respect to the digit line capacitance. As a result, thevoltage of the capacitor, voltage 350 or voltage 355, may be differentand may depend on the initial state of the capacitor.

By comparing the digit line voltage to a reference voltage, the initialstate of the capacitor may be determined. For example, the referencevoltage may be an average of the quantities (voltage 335-voltage 350)and (voltage 335-355). Upon comparison, the sensed digit line voltagemay be determined to be higher or lower than the reference voltage. Avalue of the ferroelectric cell (i.e., a logic 0 or 1) may then bedetermined based on the comparison.

As discussed above, reading a DRAM memory cell may degrade or destroythe stored logic. A ferroelectric memory cell, however, may maintain theinitial logic state after a read operation. For example, if charge state305-b is stored and the read operation performed, the charge state mayreturn to initial charge state 305-b after voltage 335 is removed, forexample, by following path 340 in the opposite direction.

FIG. 4 illustrates an example array 400 that supports selection of andoperations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure. Array 400 may include aferroelectric memory cell, one or more word lines, digit lines (e.g.,115-a to 115-h, 115-n, 1115-x to 115-z, etc.), sense components (e.g.,125-a to 125-p, plates (e.g., 210-a to 210-p), and/or selectioncomponents (e.g., 220-a to 220-h), which may be examples of a memorycell 105, word line 110, digit line 115, sense component 125, plates210, and selection component 220, respectively, as described withreference to FIGS. 1, 2, or others. Array 400 may include a logicstorage component, such as a capacitor (e.g., capacitor 205 discussedwith reference to FIG. 2), which may include conductive terminals,including plate 210 and cell bottom 215 (also discussed with referenceto FIG. 2). These terminals may be separated by an insulatingferroelectric material. As described above, various states may be storedby charging or discharging capacitor 205.

In accordance with various embodiments of the present disclosure,additional elements are contemplated, although each may not beexplicitly labeled or shown. For example, in addition to selectioncomponent pair 455-a (relating to selection component 220-a andselection component 220-b) and selection component pair 455-d (relatingto selection component 220-g and selection component 220-h), array 400may include additional components or selection component pairs, or both,among other features. For example, array 400 may include selectioncomponent pair 455-b (relating to selection component 220-c andselection component 220-d) and selection component pair 455-c (relatingto selection component 220-e and selection component 220-f). As anotherexample, array 400 may include four digit lines (or another number ofdigit lines per plate (e.g., plate 210-a) that may be distinct and beseparately identified, while only some of the digit lines shown areexplicitly labeled (e.g., 115-a to 115-h, 115-n, and 115-x to 115-z,etc.).

Array 400 may also include plate pairs 445-a to 445-h, that relate totwo or more examples of plates 210 (e.g., 210-a and 210-b). In someembodiments, plate pairs 445-a to 445-h may fall within one or moreplate groups 450, such as plate group 450-a and 450-b, as shown in FIG.4. Array 400 may also include selection component pairs 455-a to 455-d,that relate two selection components 220 (e.g., 220-a and 220-b). Array400 may also include sense component groups (e.g., 460-a to 460-d), thatrelate one or more sense components 125 (e.g., 125-a to 125-d).

In some embodiments, array 400 includes eight sense components 125 foreach plate group (e.g., plate group 450-a), with each sense component125 in electronic communication with one or more digit lines (e.g.,digit line 115-a, digit line 115-b) relating to one or more plates(e.g., plate 210-a, plate 210-b). In other embodiments, array 400includes more than or fewer than eight sense components 125 for eachplate group (e.g., plate group 450-a, plate group 450-b).

In some embodiments, array 400 and the associated techniques may be usedfor vertical cut plates (e.g., plate 210-a, plate 210-b) that may beused in FeRAM or other RAM designs (e.g., resistive RAM such as CBRAM).With various plates 210, often a current relationship exists between twoplates or between multiple sets of plates. In some embodiments, thiscurrent relationship is based on two adjacent plates being coupled orotherwise having a path between that supports unintended communication,inducement, interference, or electron flow. The relationship betweensuch plates may be referred to as an electric current relationship or aperformance-based relationship, or the like, because there may be a flowof or effects on current between the two plates. This electric currentrelationship may, in some embodiments, include a short circuit existingbetween the two plates, among other things.

In some embodiments, based on identifying an electric currentrelationship between two plates (e.g., plate 210-a and 210-b), two ormore plates 210 may be selected. This selection may include grouping twocell plates into a plate pair (e.g., plate pair 445-a) to facilitatereading, writing, or other operations, despite the electric currentrelationship between the two plates.

As one example, plate 210-a (in the “0” position) and plate 210-b (inthe “1” position) may have an electric current relationship, which maybe understood as an “even-odd” electric current relationship (based onthe “0” and “1” positions of the plates 210). In some embodiments, thiselectric current relationship may be identified or determined based onbiasing one of the plates or some other method or technique. Forexample, by biasing plate 210-a for a read operation, and knowing thatbiasing plate 210-a should cause the plate 210-b to have a current orother value below a threshold, it may be determined that an electriccurrent relationship exists between plate 210-a and plate 210-b if thecurrent (or other value) of plate 210-b is above the threshold. In someembodiments, this identifying, determining, or selecting may beperformed during testing, while in other embodiments, this identifying,determining, or selecting may be performed on a finished product thathas a capability or one or more structural features to enable aselection of cell plates based on an electric current relationship.

In some embodiments, based on identifying this or other electric currentrelationships, plate pair 445-a may be selected. This selecting ofplates 210-a and 210-b may be accompanied by selecting a selectioncomponent pair 455-a that selects selection component 220-a and 220-b,as an example. By selecting plates 210-a and 210-b and selectioncomponents 220-a and 220-b (and corresponding word and digit lines(e.g., 115-a to 115-h)), each of sense components 125-a to 125-h may beappropriately populated with data, and sense component groups 460-a and460-b may be fully populated to allow for read, write, or otheroperations.

In some embodiments, based on identifying an electric currentrelationship between plates 210-a and 210-b (as one example) within afirst plate group 450-a, one or more other plate pairs (e.g., 445-b,455-c) may be selected. For example, selecting plates 210-g and 210-hmay be accompanied by selecting a selection component pair 455-d thatselects selection components 220-g and 220-h. By selecting plates 210-gand 210-h and selection components 220-g and 220-h (and correspondingword and digit lines, each of sensing components 125 corresponding tothe digit lines 115 may be appropriately populated with data and thesense component group 460 may be fully populated to allow for read,write, or other operations.

In some embodiments, one set of selection components 220 (among othercomponents or elements) may be in electronic communication with orrelate to multiple plate groups 450, plates 210, or other sets of memorycomponents. For example, one set of selection components 220 (e.g.,selection components 220-a to 220-h) may facilitate or perform selectionof one or more plates 210 related to one or more plate groups 450 (e.g.,plate group 450-a, plate group 450-b).

Additionally or alternatively, one or more other sets of selectioncomponents 220 (among other components or elements) may be in electroniccommunication with or relate to multiple plate groups 450, plates 210,and/or other sets of memory components. As an example, one set ofselection components 220 (e.g., selection components 220-a to 220-h) mayfacilitate or perform selection of one or more plates related to oneplate group 450 (e.g., plate group 450-a) and another set of selectioncomponents 220 (e.g., selection components 220-i to 220-p) mayfacilitate and/or perform selection of one or more plates 210 related toone plate group 450 (e.g., plate group 450-b).

In some embodiments, the array 400 may include plate pairs (e.g., 445-a,445-b, 445-c, 445-d), that fall within the same plate group 450-a andmay be selected based on an electric current relationship between plates210 within the plate group 450-a.

In some embodiments, the array 400 may include plate pairs 445 (e.g.,445-e, 445-f, 445-g, 445-h), that fall within another plate group 450-band may be selected based on an electric current relationship betweenplates within another plate group 450, such as plate group 450-a. Thisselection may be based on multiple factors, including the granularity ofthe selection, the determination, the identification, or the array, asdiscussed below.

For example, in some embodiments, an element of array 400 (or somerelated component or element discussed in other figures, such as memorycontroller 140) may be configured to select the plate groups 450 shownin FIG. 4 based on an electric current relationship between plates 210-aand 210-b. Based on determining (via a read or write operation ormonitoring performance of one or more plates) or identifying theelectric current relationship, one or more elements (e.g., a fuse)associated with groups of plate groups may initiate or be related to theselection of the plate pairs (e.g., 445-a to 445-h, etc.). In someembodiments, the number of elements or components facilitating selectionof the plates/or plate pairs may be minimal and may be based onprojected or known design parameters (including, for example, one ormore known electric current relationships between plates).

For example, in some embodiments, a die may include one elementfacilitating selection of the plates (e.g., one fuse) to provide thedesired selection and pairing capabilities relating to varioustechniques or methods. In such cases, when the one fuse is triggered,then one plate pair, multiple plate pairs, or every plate on the die maybe grouped into a plate pair based on one or more identified ordetermined electric current relationships (e.g., whether some areeven-odd or whether some are odd-even). Based on the fuse beingtriggered, every plate may be selected to be paired in an odd-even(e.g., barrel shift) relationship to mitigate the effects of the one ormore (identified, determined, and/or unknown) electric currentrelationships. This barrel shift relationship \or selection, allows forgroupings relating to one plate from a first plate group and one platefrom a second plate group, among other examples. Barrel shifting (orcyclic shifting) as applied herein is discussed in further detail withreference to FIG. 5, among others.

In some embodiments, the selection may be more granular and may applyonly to the plates in the electric current relationship, those in thesame plate group, in adjacent plate groups, and/or some other structureof a larger memory sample (e.g., one or more dies, banks, subsets of oneor more banks, half banks, sections, half sections, and/or subsets ofone or more banks, groups, sections, etc.). For example, in someembodiments, each section may include one set of fuses (and/or someother element and/or component) per section (with hundreds of sectionson a memory chip), which would allow for many more defects and/orelectric current relationships on a memory chip and which would alsoallow for more granular adjustment and/or selection by section (and/or abank that includes multiple sections) based on the designed granularity.In some embodiments, the selected granularity and associatedfuse(s)/fuse sets may be based on actually identifying or determining anamount of and/or a location of one or more defects (e.g., electriccurrent relationships). In other embodiments, the selected granularityand associated fuses/fuse sets may be based on projected, expected,and/or calculated identifying or determining of an amount of and/or alocation of one or more defects (e.g., electric current relationships),based on past yield, design parameters, required robustness, somecombination, and/or other factors and/or parameters.

In some embodiments, selecting one or more plate pairs may be performedbefore and/or during an identifying and/or a determining of one or moreelectric current relationships between one or more plate pairs. Forexample, by detecting various features, qualities, and/or measurementsat one or more various granularities, such as a section, one or moreelements or components could report, identify, read, and/or determineperformance factors and/or characteristics (e.g., timing, current,voltage, resistance, etc.) related to and/or specific to one or moregranularities. Then, based on the detecting relating to one or moreplates, as an example, a second plate and/or other plates and/or platepairs related to the one or more plates may be selected. If one or moreperformance factors (among other detected information) increases,decreases, and/or is modified, then an electric current relationship(among other things) may exist between the one or more plates and thesecond plate. Then, additional pairings, selections, and/or shifts maybe derived from the electric current relationship relating to the one ormore plates and the second plate, among others.

FIG. 5 illustrates an example array 500 that supports selection of andoperations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure. Array 500 may include aferroelectric memory cell, one or more word lines, digit lines (e.g.,115-a to 115-h, 115-n, 115-x, 115-z, etc.), sense components 125 (e.g.,125-a to 125-p), plates 210 (e.g., 10-a to 210 p), and selectioncomponents 220 (e.g., 220-a to 220-h), which may be examples of a memorycell 105, word line 110, digit line 115, sense component 125, plates210, and selection component 220, respectively, as described withreference to FIGS. 1, 2, 4, or others. Array 500 may include a mayinclude a logic storage component, such as a capacitor (e.g., capacitor205 discussed with reference to FIG. 2), which may include conductiveterminals, including plate 210 and cell bottom 215 (also discussed withreference to FIG. 2). These terminals may be separated by an insulatingferroelectric material. As described above, various states may be storedby charging or discharging capacitor 205. Array 500 may include featuresimilar to, the same as, or different from those discussed with respectto array 400 or other features, methods, techniques, and structuresdiscussed with or relating to FIGS. 4 and 6, among others.

In accordance with various embodiments of the present disclosure,additional elements are contemplated, although each may not beexplicitly labeled or shown. For example, in addition to selectioncomponent pair 455-a (relating to selection component 220-a), selectioncomponent pair 455-b (relating to selection component 220-b andselection component 220-c), and selection component pair 455-e (relatingto selection component 220-h), array 500 may include additionalcomponents. For example, array 500 may include selection component pair455-c (relating to selection component 220-d and selection component220-e), selection component pair 455-d (relating to selection component220-f and selection component 220-g), or both. As another example, array500 may include four digit lines (or another number of digit lines perplate 210 (e.g., plate 210-a) that may be distinct and be separatelyidentified, while only some of the digit lines shown are explicitlylabeled (e.g., 115-a to 115-h, 115-n, and 115-x to 115-z, etc.).

Array 500 may also include plate pairs 445-a to 445-i, that relate totwo or more of plates 210 (e.g., 210-b and 210-c). In some embodiments,plate pairs 445-a to 445-i may fall within one or more plate groups 450,such as plate group 450-a and 450-b, as shown in FIG. 5. Array 500 mayalso include selection component pairs 455 (e.g., 455-a to 455-e), thatrelate two selection components 220 (e.g., 220-b and 220-c). Array 500may also include sense component groups 460-a to 460-d, that may relateto multiple sense components 125 (e.g., 125-a to 125-d).

In some embodiments, based on identifying an electric currentrelationship between two plates (e.g., plate 210-b and 210-c), two ormore plates 210 may be selected. This selection may include grouping twocell plates into a plate pair (e.g., plate pair 445-b) to facilitatereading, writing, or other operations, despite the electric currentrelationship between the two plates.

As one example, plate 210-b (in the “1” position) and plate 210-c (inthe “2” position) may have an electric current relationship, which maybe understood as an “odd-even” electric current relationship (based onthe “1” position and “2” position of the plates 210). In someembodiments, this electric current relationship may be identified ordetermined based on biasing one of the plates or some other method ortechnique. For example, by biasing plate 210-b for a read operation, andknowing that biasing plate 210-b should cause the plate 210-c to have acurrent or other value below a threshold, it may be determined that anelectric current relationship exists between plate 210-b and plate 210-cif the current (or other value) of plate 210-c is above the threshold.In some embodiments, this identifying, determining, or selecting may beperformed during testing, while in other embodiments, this identifying,determining, or selecting may be performed on a finished product thathas a capability or one or more structural features to enable aselection of cell plates based on an electric current relationship.

In some embodiments, based on identifying this or other electric currentrelationships, plate pair 445-b may be selected. This selecting ofplates 210-b and 210-c may be accompanied by selecting a selectioncomponent pair 455-b that selects selection component 220-b and 220-c,as one example. By selecting plates 210-b and 210-c and selectioncomponents 220-b and 220-c (and corresponding word and digit lines),each of the corresponding sensing components 125 (e.g., 125-a to 125-h)may be appropriately populated with data and sense component groups460-a and 460-b may be fully populated to allow for read, write, andother operations.

In some embodiments, based on identifying an electric currentrelationship between plates 210-b and 210-c (as an example) within afirst plate group 450-a, one or more other plate pairs 445 (e.g., 445-c,445-d) may be selected. This selecting of plates 210-f and 210-g may beaccompanied by selecting a selection component pair 455-d that selectsselection component 220-f and 220-g. By selecting plates 210-f and 210-gand selection components 220-f and 220-g (and corresponding word anddigit lines), each of sensing components 125 corresponding to the digitlines may be appropriately populated with data and the sensing componentgroups may be fully populated to allow for read, write, and otheroperations.

In some embodiments, one or more plates and one or more plate pairs maybe selected based on a relationship relating to the one or more platesor the one or more plate pairs, or both. In some embodiments, thisrelationship may include a spatial relationship, such as an absolutelocation or locations, a relative location or locations of one, two,and/or more plates and/or pairs, plate addresses of one or more platesor related cells (including absolute or relative plate addresses, orboth), some combination, or other things. In some embodiments, thisrelationship may include a location, such as a location proximate,directly or immediately next to, or adjacent to one, two, or more platesor pairs, among other things. In some embodiments, plates within a plategroup (e.g., plate group 450-a) may be proximate and/or adjacent toother plates within the plate group. In other embodiments, plates withindifferent plate groups (e.g., plate 210-h and plate 210-i of plategroups 450-a and 450-b respectively), may be located adjacent eachother.

In some embodiments, based on identifying an electric currentrelationship between plates 210-b and 210-c (as an example) within afirst plate group 450-a, one or more other plate pairs (e.g., 445-a,455-e) may be selected. In some embodiments, a first plate (e.g., plate210-h) may be selected with a second plate (e.g., plate 210-i), that maybe related to a second plate group (e.g., plate group 450-b). In someembodiments, this selection may include a barrel shift, a barrelselection, a wraparound shift, or a wraparound selection, or somecombination, among other variations. This selecting of plates 210-h and210-j may be accompanied by selecting a selection component pair 455-ethat selects selection component 220-h and one or more other selectioncomponents 220. In some embodiments, these one or more selectioncomponents 220 may include a selection component 220 associated withanother group (e.g., the first selection component of another selectioncomponent group) or these one or more selection components 220 mayinclude selection component 220-a from the first selection componentpair 455 (e.g., a group) that may then be paired with selectioncomponent 220-h, or some combination.

Similarly, in some embodiments, a first plate (e.g., plate 210-p) may beselected with a second plate (e.g., plate 210-a, another plate [notshown]), that may be related to the first plate group (e.g., 450-a) anda third plate group (e.g., 450-c).

By selecting plates in an odd-even plate pair (e.g., 210-f and 210-g andselection components 220-f and 220-g (and corresponding word and digitlines), each of sensing components 125 corresponding to the digit lines115 may be appropriately populated with data and the one or more sensecomponent groups 460 may be fully populated to allow for read, write, orother operations.

For example, as shown in FIG. 4 the selection component 220 (e.g., 220-ato 220-h), which may in some embodiments each be an example of atransistor capable of being selected, are arranged to connect therespective digit lines (e.g., 115-a to 115-h) from respective plates(e.g., 210-a to 210-h) to the sense components (e.g., sense components125-a to 125-h) to facilitate the selection of one or more plate pairs.Digit lines from some plates (e.g., plates 210-a, 210-c, 210-e, 210-g)may connect to or be in electronic communication with a first sensecomponent group (e.g., sense component group 460-a). Digit lines fromsome plates (e.g., plates 210-b, 210-d, 210-f, 210-h) may connect to orbe in electronic communication with a second sense component group(e.g., sense component group 460-b). In some embodiments, when one ormore plate pairs (e.g., 445-a, 445-b, 445-c, 445-d) are selectedregardless of each pair's order (e.g., odd-even, even-odd, some otherorder), the first sense component group and the second sense componentgroup will be correctly populated with data. The same principles,actions, and operations apply equally to other embodiments, methods, andtechniques described in the present disclosure.

In accordance with various embodiments of the present disclosure, oneset of selection components (among other components or elements) may bein electronic communication with or relate to multiple plate groups,plates, or other sets of memory components. For example, one set ofselection components (e.g., selection components 220-a to 220-h) mayfacilitate or perform selection of one or more plates related to one ormore plate groups (e.g., plate group 450-a, plate group 450-b), or somecombination of both.

Additionally alternatively, one or more other sets of selectioncomponents 220 (among other components or elements) may be in electroniccommunication with or relate to multiple plate groups, plates, and/orother sets of memory components. As an example, one set of selectioncomponents 220 (e.g., selection components 220-a to 220-h) mayfacilitate or perform selection of one or more plates related to oneplate group (e.g., plate group 450-a) and another set of selectioncomponents 220 (e.g., selection components 220-h to 220-p) mayfacilitate or perform selection of one or more plates related to one ormore other plate groups (e.g., plate group 450-b).

In some embodiments, the array 500 may include plate pairs (e.g., 445-b,445-c, 445-d), that fall within the same plate group 450-a and may beselected based on an electric current relationship between plates withinthe plate group 450-a and/or one or more other plate groups.

In some embodiments, the array 500 may include plate pairs (e.g., 445-a,445-e, 445-f, 445-g, 445-h), that fall within one or more other plategroups (e.g., 450-b, 450-c) and may be selected based on an electriccurrent relationship between plates within the same plate group or oneor more other plate groups, such as plate group 450-a and/or 450-b,among others. This selection may be based on one or more factors,including the granularity of the selection and/or related components,the array design, the existence of one or more electric currentrelationships, one or more plate group designs, one or more elements orcomponents of the array and/or a memory cell and/or an electronic memoryapparatus, performance relationships, current relationships, electroniccommunication relationships, status determinations and/oridentifications, some combination, and/or other factors.

For example, in some embodiments, an element of array 500 (and/or somerelated component and/or element discussed in other figures, such asmemory controller 140) may be configured to select the plate groupsshown in FIG. 4 and/or FIG. 5 based on an electric current relationshipbetween plates 210-b and 210-c. Based at least in part on determining(via a read or write operation or monitoring performance of one or moreplates, among other methods and techniques) and/or identifying theelectric current relationship, one or more elements (e.g., a fuse)associated with one or more groups of plate groups may initiate theselection of the plate pairs (e.g., 445-a to 445-i, etc.).

In some embodiments, the selection may be more granular and may applyonly to the plates in the electric current relationship, those in thesame plate group, in adjacent plate groups, and/or some other subsectionof a larger memory sample.

In some embodiments, methods and techniques for operating aferroelectric memory cell in accordance with various embodiments of thepresent disclosure are described. The methods and techniques may includeidentifying a first cell plate included in a first cell plate group,identifying a second cell plate that is adjacent to the first cell plateand included in the first cell plate group or a second cell plate group,and selecting the first cell plate and the second cell plate based atleast in part on an electric current relationship between the first cellplate and the second cell plate, among other operations.

In some embodiments, an electric current relationship may include, amongother things, a short between a first cell plate and the second cellplate. In some embodiments, an electric current relationship mayinclude, among other things, a first current level of a first cell plateand/or a second current level of a second cell plate. In someembodiments, the first current level results from applying a voltage toa first cell plate and the second current level results from applyingthe voltage to a second cell plate.

In some embodiments, in accordance with various embodiments of thepresent disclosure, one or more cell plates may be contained in one ormore groups and may be organized and/or ordered with one or morepositions within the one or more groups. In some embodiments, the firstcell plate and/or the second cell plate may be included in the firstcell plate group. In some embodiments, the first cell plate may beincluded in the first cell plate group and/or the second cell plate maybe included in the second cell plate group. In some embodiments, thefirst cell plate is in a last position in the first cell plate groupand/or the second cell plate may be in a first position in the secondcell plate group.

One operation that may be performed relating to one or more cell platesmay include a reading operation, including a value-based or alogic-based reading operation. In some embodiments, methods andtechniques for operating a memory cell in accordance with variousembodiments of the present disclosure may include reading informationfrom the first cell plate and the second cell plate based at least inpart on reading information from a first sense amp in electroniccommunication with the first cell plate and a second sense amp inelectronic communication with the second cell plate. In someembodiments, methods and techniques may include reading information fromthe first cell plate and the second cell plate in combination based atleast in part on the selection.

In some embodiments, methods and techniques for operating a memory cellin accordance with various embodiments of the present disclosure mayinclude identifying a third cell plate included in a third cell plategroup, identifying a fourth cell plate included in the second cell plategroup or the third cell plate group, identifying the third cell plateadjacent to the fourth cell plate, and selecting the third cell plateand the fourth cell plate as a pair based at least in part on theelectric current relationship between the first cell plate and thesecond cell plate.

In some embodiments, in accordance with various embodiments of thepresent disclosure, one or more cell plates may be contained in one ormore groups and may be organized or ordered with one or more positionswithin the one or more groups. In some embodiments, the third cell platemay be included in the third cell plate group and/or the fourth cellplate may be included in the second cell plate group. In someembodiments, the third cell plate may be in a first position in thethird cell plate group and/or the fourth cell plate may be in a lastposition in the second cell plate group.

FIG. 6 illustrates example arrays 605 to 625 that each support selectionof and operations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure. Each of arrays 605-625may include a ferroelectric memory cell, one or more word lines, digitlines, one or more sense components, one or more plates (e.g., plates210-a to 210-p), selection components, or plate groups (e.g., plategroup 450-a, plate group 450-b), which may be embodiments of a memorycell 105, word lines 110, digit lines 115, sense components 125, plates210, and/or selection components 220, respectively, as described withreference to FIGS. 1, 2, 4, 5, or others. Each of arrays 605-625 mayinclude features similar to, the same as, or different from thosediscussed with respect to array 400, array 500, and other features,methods, techniques, and structures discussed with or relating to FIGS.1-5, among others.

In some embodiments, in accordance with various embodiments of thepresent disclosure additional elements are contemplated, although eachmay not be explicitly labeled and/or shown. For example, in addition tothe plate groups (e.g., 450-a), the plates (e.g., 210-a), the platepairs (e.g., 665-a), and the current performance relationships (e.g.,665-a), shown in FIG. 6, other elements or components disclosed,described, or contemplated based on FIGS. 1-5, among others are alsoenvisioned. For example, although FIG. 6 does not explicitly show digitlines, word lines, selection components, sensing components, or otherelements described or shown in FIGS. 1-5 (among others), each of these,alone or in combination are contemplated by the present disclosure,including in the embodiments shown and described relative to FIG. 6.

The example arrays 605 to 625 illustrate various electric currentrelationship, including shorts, that may existing between cell plates ofthe arrays.

As shown in example array 605, plates 210-a through 210-h are organizedas part of plate group 450-a and plates 210-i through 210-p areorganized as part of plate group 450-b. In some embodiments, based atleast in part on one or more identifications or determinations, anelectric current relationship 665-a is detected. Based at least in parton this detection of electric current relationship 665-a, one or moreplate pairs (e.g., plate pair 645-a) is selected by one or more systemelements or components. In some embodiments, a first plate pair 645-a isidentified as corresponding to the even-odd relationship of plates 210-aand 210-b relating to electric current relationship 665-a. As discussedin the present disclosure, one or more elements may perform theselection of plates 210-a and 210-b based at least in part on thedetected electric current relationship 665-a is directly related toplates 210-a and 210-b.

In some embodiments, the plate pair 645-a may be individual and no otherplate pair in the same plate group (e.g., plate group 450-a) or in otherplate groups (e.g., plate group 450-b) may be selected based at least inpart on the electric current relationship 665-a. This single pairgranularity in identifying, determining, or selecting may apply incertain designs or other embodiments. For example, this single pairselection decreases power consumption associated with alternativeembodiments that may require reading, writing, or performing otheroperations based on multiple, numerous, or every two plates in sections,columns, dies, bank, and/or other structures.

In some embodiments, the plate pair 645-a may be individual to a firstplate group (e.g., 450-a) and may relate to or otherwise correspond withplate pair 645-b, as shown in example array 605. In this example, one ormore elements or components may select one plate pair in a first group(e.g., plate group 450-a) and one plate pair in one or more other plategroups (e.g., plate group 450-b). In some embodiments, these plate pairs(e.g., 645-a and 645-b) may be selected based on the electric currentrelationship 665-a, among other parameters, factors, or conditionsrelating to array 605 or other system elements or components. In someembodiments, a selection of plate pair 645-a and 645-b may be based ondetermining the electric current relationship 665-a that affects a firstplate in a first group (e.g., plate 210-a of plate group 450-a) and asecond plate in the first group (e.g., plate 210-b of plate group450-a). In some embodiments, based on identifying the electric currentrelationship 665-a, a selection of plate pair 645-b may be performedbefore, during or after a selection of plate pair 645-a is performed.Thus, the indirect selection of plates 210-i and 210-j may be based onan electric current relationship between other plates (e.g., plates210-a, and 210-b in array 605) may be performed independent of, inaddition to, instead of, or otherwise be related to the direct selectionbased on the electric current relationship (e.g., 665-a) between thespecific plates having the electric current relationship (e.g., plates210-a and 210-b in array 605).

As shown in example array 610, plates 210-a through 210-h are organizedas part of plate group 450-a and plates 210-i through 210-p areorganized as part of plate group 450-b. In some embodiments, based onone or more identifications or determinations, electric currentrelationship 665-b is detected (e.g., identified, determined, etc.).Based at least in part on this detection of electric currentrelationship 665-b, one or more plate pairs (e.g., plate pair 645-c) isselected by one or more system elements or components. In someembodiments, a first plate pair 645-c is identified as corresponding tothe even-odd relationship of plates 210-a and 210-b relating to electriccurrent relationship 665-b. As discussed in the present disclosure, oneor more elements may perform the selection of plates 210-c and 210-dbased on the detected electric current relationship 665-b that isindirectly related to plates 210-c and 210-d. In addition, based on thedetection of electric current relationship 665-b, the selection of platepair 645-c, some combination, and/or other information, plate pair 645-dmay be selected. In some embodiments, plate pair 645-d may be selectedbased on the relative position of each plate (e.g., plate 210-k being inthe “2” position and plate 210-l being in the “3”) and this may or maynot be related to the relative position of one or more other plates(e.g., plate 210-c being in the “2” position and plate 210-d being inthe “3”).

In some embodiments, as shown in example array 610, plate pair 645-d maycorrespond to the relative position of plate pair 645-c (which includesplate 210-c and plate 210-d), shown in the “2” and “3” position of plategroup 450-a. In some embodiments, as shown in example array 610, platepair 645-d may correspond to the relative location of and ordered ofelectric current relationship 665-b (which is based on plates 210-a and210-b), shown in the “0” and “1” position of plate group 450-a. Forexample, the ordered of electric current relationship 665-b (e.g.,even-odd) may at least partially affect or otherwise influence selectionof plate pair 645-d (relating to plates 210-k and 210-l).

In some embodiments, as shown in example array 615, multiple electriccurrent relationships may exist between plates in one or more plategroups. For example, one or more identifications or determinations maybe performed to determine at least one of electric current relationship665-c and electric current relationship 665-d that may each affect twoor more plates (e.g., plates 210-a, 210-b, 210-e, 210-f), among otherelements or components.

In some embodiments, based on identifying or determining electriccurrent relationship 665-c or electric current relationship 665-d, oneor more selections may be made that correspond to plate pair 645-e or645-f, among others. By comparing the spatial relationship of one ormore electric current relationships, the order of plates, the relativeposition of plates (even-odd, odd-even), and/or other factors, one ormore plate pairs may be selected using a controller, one or more fuses,one or more other elements or components, some combination, and/or otherstructures.

Alternatively or additionally, based on identifying or determining(among other operations) one or more electric current relationships inone or more plate groups, specific plate pairs (e.g., 645-e, 645-f,645-g) are selected. In some embodiments, this selection may be based onidentifying or determining some, a majority of, or all electric currentrelationship present in one plate group, multiple plate groups, or everyplate group within a certain die, bank, section, group, and/or othersubset. For example, by identifying, comparing, or otherwise determiningelectric current relationships 665-c, 665-d, 665-e, 665-f, and 665-g oneor more plate pairs (e.g., 645-e, 645-f, 645-g) may be selected. In someembodiments, this detection may be based on comparing or determiningwhether each electric current relationship is an even-odd or an odd-evenelectric current relationship.

In some embodiments, this detection may be based on comparing and/ordetermining whether one or more electric current relationships isdetermined to be similar to one or more other electric currentrelationships, without determining whether the one or more electriccurrent relationships is odd-even, even-odd, affects the first and thesecond plates, affects the second and the third plates, and/or somecombination. For example, this detection may be based on comparingand/or determining whether electric current relationship 665-c issimilar to electric current relationship 665-d and/or electric currentrelationship 665-e, without a determination of whether each of theelectric current relationships is even, even-odd, affects the first andthe second plates, affects the second and the third plates, affectsother plates, and/or some combination.

In other embodiments, this detection may be made independent of ordependent on comparing or determining whether each electric currentrelationship is an even-odd or an odd-even electric currentrelationship.

In some embodiments, as shown in example array 620, multiple electriccurrent relationships may exist between plates in a first plate group, asecond plate group, and/or between a first plate and a second plategroup (among other variations). For example, one or more identificationsor determinations may be performed to determine at least one of electriccurrent relationship 665-h, 665-i, and 665-j that each affect two ormore plates (e.g., plates 210-b and 210-c, 210-h and 210-i, 210-l and210-m), among other elements or components.

In some embodiments, based on identifying or determining one or more ofelectric current relationships 665-h, 665-i, and/or 665-j, one or moreselections may be made that correspond to plate pair 645-h or 645-i,among others, or some combination. By comparing the spatial relationshipof one or more electric current relationships, the order of plates, therelative position of plates (even-odd, odd-even), and/or other factors,one or more plate pairs may be selected. In some embodiments, selectionmay be based on one or more of electric current relationships betweendistinct plate groups and/or subgroups. For example, as shown in examplearray 620, one or more of electric current relationships (e.g., electriccurrent relationships 665-i) may be present between a first plate group(e.g., 450-a) and a second plate group (e.g., 450-b), or between thesecond plate group (e.g., 450-b) and an additional plate group (e.g., athird plate group).

Based at least in part on the one or more of electric currentrelationships between two or more plate groups, one or more plate pairsor groups may be selected. In some embodiments, based on determining afirst electric current relationship (e.g., electric current relationship665-i) one or more plate pairs may be selected. The one or more platepairs selected may include those in similar absolute and/or relativepositions (e.g., position “7” and position “0”), may be of similar order(e.g., odd-even like electric current relationship 665-i), and/or otherfactors.

In some embodiments, selecting one or more plate pairs may be based ondetermining that two or more electric current relationships (e.g.,electric current relationship 665-i and electric current relationship665-j) affect one plate group. By determining that the two or moreelectric current relationships affect the one plate group (e.g., plategroup 450-b), one or more selections may be made with respect to theaffected plate group (e.g., plate group 450-b) and/or one or more otherplate groups (including, but not limited to, two or more other plategroups that border or are adjacent to plate group 450-b and those thatdo not border or are not adjacent to plate group 450-b but may still becontained within the same die bank or section).

In some embodiments, as shown in example array 625, multiple electriccurrent relationships may exist between plates in a first plate group, asecond plate group, or between a first plate and a second plate group(among other variations). For example, one or more identifications ordeterminations may be performed to determine at least one of electriccurrent relationship 665-k, 665-l, and/or 665-m that each affect two ormore plates (e.g., plates 210-b and 210-c, 210-h and 210-i, 210-l and210-m), among other elements or components.

In some embodiments, based on identifying or determining one or more ofelectric current relationships 665-k, 665-l, and/or 665-m, one or moreselections may be made that correspond to plate pair 645-j, 645-k,and/or 645-l, among others. By comparing the spatial relationship of oneor more electric current relationships, the order of plates, therelative position of plates (even-odd, odd-even), and/or other factors,one or more plate pairs may be selected. In some embodiments, selectionmay be based on one or more of electric current relationships betweendistinct plate groups. For example, as shown in example array 625, oneor more of electric current relationships (e.g., electric currentrelationships 665-l) may be present between a first plate group (e.g.,450-a) and a second plate group (e.g., 450-b), and/or between the secondplate group (e.g., 450-b) and an additional plate group (e.g., a thirdplate group).

Based at least in part on the one or more of electric currentrelationships between two or more plate groups, one or more plate pairsor groups may be selected. In some embodiments, based on determining afirst electric current relationship (e.g., electric current relationship665-l or 665-k) one or more plate pairs may be selected. The one or moreplate pairs selected may include those in similar absolute or relativepositions (e.g., position “7” and position “0” as depicted by plate pair645-k), may be of similar order (e.g., odd-even like electric currentrelationship 665-i or 665-l), and/or other factors.

In some embodiments, selecting one or more plate pairs may be based ondetermining that two or more electric current relationships have asimilar order (e.g., odd-even, even-odd) and/or the relative position ofat least one of the plates in a plate pair (e.g., plate pair 645-k). Forexample, an initial determination may be made regarding the order ofsome, a majority of, and/or all detected electric current relationshipswithin a designated set (e.g., section, die, bank, group, subset). Bydetermining that at least one of the detected electric currentrelationship(s) (e.g., electric current relationship 665-i and electriccurrent relationship 665-j) affect a specific plate and/or a specificplate pair (e.g., based on an odd-even order, affect plate in position“7” such as 210-h, etc.), a plate pair including at least one plate froma first plate group and at least one plate from a second plate group maybe selected (e.g., a first plate and plate 210-a as shown by plate pair645-j, plate 210-h and 210-i as shown by plate pair 645-k, etc.).

In some embodiments, the selection may be based on determining whethereach electric current relationship (e.g., 665-k, 665-l, 665-m) includesa particular order (or not) such as even-odd or odd-even (or moresophisticated orders involving additional plates) and if all of theplate relationships are similar based on the relative position (e.g.,position “0” or “4” or “7”) of one or more plates directly and/orindirectly affected by at least one electric current relationship.

In some embodiments, the selection may be based on determining whether asubset of the electric current relationships (e.g., 665-l) includes aparticular order (or not) such as even-odd or odd-even (or moresophisticated orders involving additional plates) and performing aselection irrespective of the existence of one or more other electriccurrent relationships, the order of the plates of one or more otherelectric current relationships, the absolute or the relative position ofone or more other electric current relationships, some combination, orother factors. For example, based on determining or identifying electriccurrent relationship 665-l, a selection of plates 210-h and/or 210-i maybe made to form plate pair 645-k. Alternatively, or additionally, basedon the identifying or the determining regarding plate pair 645-k allother similarly positioned pairs within a section and/or othergranularity (e.g., bank, die) may be selected. For example, based on theidentifying or the determining regarding plate pair 645-k, other platepairs in the same positions (e.g., positions “7” and “0” in thisexample) may be paired leading to selecting plate pair 645-j or platepair 645-l, among others.

Alternatively, or additionally, based on the identifying or thedetermining regarding plate pair 645-k all other plates within a sectionand/or other granularity (e.g., bank, die) may be selected in a similarfashion. For example, based on the identifying or the determiningregarding plate pair 645-k, all other plates irrespective of theirposition and/or other characteristics may be paired leading to selectingplates 210-b and 210-c, 210-d and 210-e, 210-f and 210-g, 210-j and210-k, 210-l and 210-m, 210-n and 210-o, a first plate and plate 210-ain plate pair 645-j, a second plate and plate 210-p in plate pair 645-l,and/or others.

In some embodiments, electronic memory apparatuses in accordance withvarious embodiments of the present disclosure are described. Theelectronic memory apparatuses may include a first cell plate group, asecond cell plate group, a first cell plate included in the first cellplate group, or a second cell plate adjacent to the first cell plate andincluded in the first cell plate group or the second cell plate group.In some embodiments, the first cell plate and the second cell plate maybe in electronic communication.

In some embodiments, the electronic communication may include, amongother things, a short between a first cell plate and the second cellplate. In some embodiments, the electronic communication is based on aproximity of the first cell plate to the second cell plate. As describedin accordance with various embodiments of the present disclosure, theproximity may include one or more absolute locations or positions,relative locations or positions, a position adjacent another cell platein the same group, a position adjacent another cell plate in at leastone other group, some combination, or other variations.

In some embodiments, electronic memory apparatuses in accordance withvarious embodiments of the present disclosure may include a first digitline in electronic communication with the first cell plate and a firstsense amp via a first transistor. In some embodiments, electronic memoryapparatuses in accordance with various embodiments of the presentdisclosure may include a second digit line in electronic communicationwith the second cell plate and a second sense amp via a secondtransistor. In some embodiments, the first transistor and/or the secondtransistor may be embodiments of a sense component in accordance withvarious embodiments of the present disclosure.

In some embodiments, in accordance with various embodiments of thepresent disclosure, one or more cell plates may be contained in one ormore groups and may be organized and/or ordered with one or morepositions within the one or more groups.

In some embodiments, the first cell plate and the second cell plate areeach included in the first cell plate group. In some embodiments, thefirst cell plate is included in the first cell plate group and thesecond cell plate is included in the second cell plate group. In someembodiments, the first cell plate is included in one cell plate groupand the second cell plate is included in another cell plate groupdifferent from the cell plate group of the first cell plate. In someembodiments, the first cell plate is in a first position in the firstcell plate group and the second cell plate is in a last position in thesecond cell plate group. In some embodiments, the first cell plate is ina last position in the first cell plate group and the second cell plateis in a first position in the second cell plate group. In someembodiments, the first cell plate is not in a first position in thefirst cell plate group and/or the second cell plate is not in a lastposition in the second cell plate group.

In some embodiments, in addition to employing the methods and thetechniques that support selection of and operations relating to cellplates and plate pairs as described in the present disclosure,additional methods and techniques involving redundant memory elements orcomponents may be used. For example, certain design parameters mayrequire having a redundancy level that may have required whole redundantsections (and/or more localized, but more costly redundancy based ongroups, etc.). But based on the use of plate selection and use of one ormore plate pairs within a plate group, section, bank, die, or otherorganization, the need for redundant sections may be greatly reduced(and in some embodiments eliminated), decreasing the costs of redundantmemory sections and avoiding expensive localized redundancy controls(e.g., plate groups, etc.). The use of the plate selection techniquesand methods associated herein enable existing memory elements to be morerobust and avoid wholesale discarding of groups, sections, bank, and/ordies based on minor electric current performance relationships, that mayinclude shorting between vertical cut plates, among other things.

For example, where a traditional design may have required multipleredundant sections based on one or more of yield constraints defectdensity, and/or technology-dependent choices, the use of plate pairs andselection techniques relating to one or more plate pairs in a plategroup, a section, a die, a bank, a column, and/or another granularitymay reduce the required redundancy by in effect making the element moreefficient and robust by using plate selection.

In some embodiments, associated methods and techniques may includeidentifying a redundancy or a robustness factor or requirement,determining how plate selection and/or shifting of one or more platepairs will affect the redundancy or the robustness factor orrequirement, and/or reducing the redundancy or the robustness factor orrequirement based on the determining. These steps, among others, may beperformed before, as part of, or after a plate selection step or othersteps in accordance with various embodiments of the present disclosure.

This hybrid solution (including plate selection and a reduced amount ofredundant memory) may enable memory apparatuses and products to provideadditional features and capabilities without requiring thefully-duplicative, and overly-expensive solely redundant memorysolutions. In certain designs, employing the plate selection techniquesand methods may reduce brute redundancy number from three redundantsections to one redundant section, as merely one example. But, in manyembodiments, the techniques and the methods described through thepresent disclosure support selection of, shifting of, and operationsrelating to cell without the need for brute redundancy or hybridtechniques.

The example arrays 605 to 625 that each support selection of andoperations relating to cell plates merely serve as embodiments inaccordance with various embodiments of the present disclosure. Each ofthese embodiments may be modified, adjusted, duplicated, includeadditional steps, omit some steps, or otherwise adjusted based at leastin part on the various embodiments and circumstances described.

FIG. 7 shows a block diagram 700 of a memory array 100-a that supportsselection of and operations relating to one or more cell plates inaccordance with various embodiments of the present disclosure. Memoryarray 100-a may be referred to as an electronic memory apparatus and mayinclude memory controller 140-a and memory cell 105-b, which may beembodiments of memory controller 140 and memory cell 105 described withreference to FIGS. 1 and 2, among others. Memory controller 140-a mayinclude biasing component 710 and timing component 715 and may operatememory array 100-a as described in FIGS. 1-3, among others. Memorycontroller 140-a may be in electronic communication with word line110-b, digit line 115-aa, sense component 125-q, and/or plate 210-q,which may be embodiments of word line 110, digit line 115, sensecomponent 125, and plate 210 (among other embodiments) described withreference to FIG. 1-2 or 3-6, among others. Memory array 100-a may alsoinclude reference component 720 or latch 725. The components of memoryarray 100-a may be in electronic communication with one another and mayperform the functions described with reference to FIGS. 1-6, amongothers. In some embodiments, reference component 720, sense component125-q and latch 725 may be components of memory controller 140-a.

Memory controller 140-a may be configured to activate word line 110-b,plate 210-q, or digit line 115-q by applying voltages to various nodes.For example, biasing component 710 may be configured to apply a voltageto operate memory cell 105-b to read or write memory cell 105-b, asdescribed above. In some embodiments, memory controller 140-a mayinclude a row decoder, column decoder, or both, as described withreference to FIG. 1, among others. This may enable memory controller140-a to access one or more memory cells 105. Biasing component 710 mayalso provide voltage potentials to reference component 720 in order togenerate a reference signal for sense component 125-q. Additionally,biasing component 710 may provide voltage potentials for the operationof sense component 125-q.

In some embodiments, memory controller 140-a may perform its operationsusing timing component 715. For example, timing component 715 maycontrol the timing of the various word line selections or plate biasing,including timing for switching and voltage application to perform thememory functions, such as reading and writing, discussed herein. In someembodiments, timing component 715 may control the operations of biasingcomponent 710.

In some embodiments, Reference component 720 may generate a referencesignal for sense component 125-q. Reference component 720 may, forexample, include circuitry configured to produce a reference signal. Insome embodiments, reference component 720 may be other ferroelectricmemory cells 105. In some embodiments, reference component 720 may beconfigured to output a voltage with a value between the two sensevoltages, as described with reference to FIG. 3, among others. Orreference component 720 may be designed to output a virtual groundvoltage (i.e., approximately 0V).

In some embodiments, sense component 125-l may compare a signal frommemory cell 105-b (through digit line 115-aa) with a reference signalfrom reference component 720. Upon determining the logic state, thesense component may then store the output in latch 725, where it may beused in accordance with the operations of an electronic device usingmemory array 100-a, among other components or elements.

In some embodiments, memory controller 140-a may be related to or inelectronic communication with a first cell plate and a second cellplate, which may each be embodiments of various plates 210 (describedwith reference to FIGS. 1-6, among others). A first digit line may be inelectronic communication with the first cell plate and a first sensecomponent (e.g., a sense amp) via a first selection component (e.g., atransistor). A second digit line may also be in electronic communicationwith the second cell plate and a second sense component (e.g., a senseamp) via a second selection component (e.g., a transistor). In someembodiments, the memory controller 140-a may be in electroniccommunication with one or more elements of memory array 100-a (amongother memory arrays and/or memory apparatuses), including, but notlimited to, a first sense component and/or a second sense component.

Based at least in part on the electronic communication, the controllermay be operable to initiate and/or perform one or more operations. Insome embodiments, the memory controller 140-a may be operable todetermine or identify an electric current relationship relating to oneplate 210 (e.g., 210-q), relating to two distinct, proximate, oradjacent plates (e.g., two plates as described with reference to FIGS.4-6, among others), relating to one or more plates in a single plategroup, relating to two or more plates at least one of which is includedin a plate group or a section different from the others, somecombination, and/or other components or elements.

In some embodiments, this determining may include measuring, reading,writing, calculating, comparing, correlating, verifying, linking,analyzing, estimating, or assessing one or more characteristics, values,measurements, current or voltage levels or relationships, locations,performance relationships, operations, and/or other parameters specificto, relating to, or based on one or more plates, digit lines, sensecomponents, selection components, and/or plate groups, among otherthings. In some embodiments, this identifying may include detecting,distinguishing, comparing, associating, relating, measuring, reading,linking, linking, analyzing, estimating, and/or assessing one or morecharacteristics, values, measurements, current or voltage levels orrelationships, locations, performance relationships, operations, and/orother parameters specific to, relating to, or based on one or moreplates, digit lines, sense components, selection components, or plategroups, among other things. As one example, memory controller 140-a maydetermine and/or identify an electric current relationship between afirst cell plate and a second cell plate, which may be based at least inpart on reading and/or otherwise receiving information from one or moresense components each related to at least one of the first cell plateand the second cell plate.

Based at least in part on this determining or identifying, the memorycontrol may initiate (e.g., send an instruction or a signal to, orcontrol another element or component to operate to) or operate to selectthe first cell plate and the second cell plate based at least in part ona spatial relationship. This selection may, in some embodiments, includean electronic communication from the controller to one or more selectioncomponents, which may include communication with two or more selectioncomponents (e.g., including one or more selection component pairs) basedat least in part on the determining or identifying. In some embodiments,this spatial relationship may be based at least in part on an absoluteposition or a relative position of one or more cell plates or otherelements or components.

In some embodiments, this spatial relationship may be based at least inpart on the location of a first cell plate relative to a second cellplate, including whether these cell plates (and/or others) are adjacent,proximate, in a particular order, in a relative position within a group,and/or otherwise related to each other (and/or other cell plates and/orelements or components). For example, the selection may include and/orbe based at least in part on a spatial relationship relating to aposition of the first cell plate in a first cell plate group relative tothe second cell plate in the first cell plate group. The selection mayinclude and/or be based at least in part on a position of the first cellplate in a first cell plate group being in a “7” position (e.g., a lastor a final position) and second cell plate in the first cell plate groupbeing in a “0” position (e.g., a first or an initial position), a “4”position (e.g., in a non-endpoint, intermediate position), or in a “6”position (e.g., an adjacent position).

Additional cell plates may be selected (via the memory controller and/orone or more other elements or components). For example, in someembodiments, a third cell plate may be included in the first cell plategroup and a fourth cell plate may be included in the first cell plategroup, where each of these cell plates may be identified and/ordetermined as relating to the first cell plate and the second cellplate, among other elements or components. In some embodiments, memorycontroller 140-a may be operable to select the third cell plate and thefourth cell plate based at least in part on a spatial relationship. Forexample, the third cell plate and/or the fourth cell plate may beselected based at least in part on determining that the third cell plateis adjacent to at least one of (and in some embodiments, both of) thefirst cell plate and the fourth cell plate.

This selection of the third cell plate and the fourth cell plate may, insome embodiments, be based at least in part on a spatial relationship ofthe third and fourth cell plates themselves. In other embodiments, thisselection of the third cell plate and the fourth cell plate may be basedat least in part on a spatial relationship between the first cell plateand the second cell plate. In other embodiments, this selection of thethird cell plate and the fourth cell plate may be based at least in parton a spatial relationship between at least one of the first cell plateand the second cell plate with the third cell plate and the fourth cellplate.

In some embodiments, the memory controller 140-a may initiate or beoperable to read information from at least one of the first sensecomponent and the second sense component (among other elements orcomponents) based at least in part on the selection. This may include,in some embodiments, the memory controller 140-a reading values from afirst sense amp and a second sense amp on two or more selectedtransistors that correspond and/or otherwise relate to two plates havingand/or relating to an electric current relationship, among otherfactors.

FIG. 8 shows a diagram of a system 800 that supports selection of andoperations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure. System 800 may include adevice 805, which may be or include a printed circuit board to connector physically support various components. Device 805 may include amemory array 100-b, which may be an example of memory array 100described in FIG. 1 and FIG. 7, among others. Memory array 100-b maycontain memory controller 140-b and one or more memory cells 105-c,which may be embodiments of memory controller 140 described withreference to FIGS. 1 and 7, among others, and memory cells 105 describedwith reference to FIGS. 1, 2, and 7, among others. Device 805 may alsoinclude a processor 810, BIOS component 815, one or more peripheralcomponents 820, and/or input/output control component 825, among othercomponents or elements. The components of device 805 may be inelectronic communication with one another through bus 830.

Processor 810 may be configured to operate memory array 100-a throughmemory controller 140-b. In some embodiments, processor 810 performs thefunctions of memory controller 140 or 140-a, described with reference toFIGS. 1 and 7, among others. In other embodiments, memory controller140-b may be integrated into processor 810. Processor 810 may be ageneral-purpose processor, a digital signal processor (DSP), anapplication-specific integrated circuit (ASIC), a field-programmablegate array (FPGA) or other programmable logic device, discrete gate ortransistor logic, discrete hardware components, or it may be acombination of these types of components, and processor 810 may performvarious functions described herein, including performing identifying,determining, or selecting relating to one or more cell plates and/orother components or elements. Processor 810 may, for example, beconfigured to execute computer-readable instructions stored in memoryarray 100-a to cause device 805 perform various functions or tasks.

BIOS component 815 may be a software component that includes a basicinput/output system (BIOS) operated as firmware, which may initializeand run various hardware components of system 800. BIOS component 815may also manage data flow between processor 810 and the variouscomponents, e.g., peripheral components 820, input/output controllercomponent 825, etc. BIOS component 815 may include a program or softwarestored in read-only memory (ROM), flash memory, or any othernon-volatile memory.

One or more peripheral components 820 may be any input or output device,or an interface for such devices, that is integrated into device 805.Embodiments may include disk controllers, sound controller, graphicscontroller, Ethernet controller, modem, universal serial bus (USB)controller, a serial or parallel port, or peripheral card slots, such asperipheral component interconnect (PCI) or accelerated graphics port(AGP) slots.

Input/output controller component 825 may manage data communicationbetween processor 810 and peripheral components 820, input devices 835,or output devices 840. Input/output controller component 825 may alsomanage peripherals not integrated into device 805. In some embodiments,input/output controller component 825 may represent a physicalconnection or port to the external peripheral.

Input 835 may represent a device or signal external to device 805 thatprovides input to device 805 or its components. This may include a userinterface or interface with or between other devices. In someembodiments, input 835 may be a peripheral that interfaces with device805 via peripheral components 820 or may be managed by input/outputcontroller component 825.

Output device 840 may represent a device or signal external to device805 configured to receive output from device 805 or any of itscomponents. Embodiments of output device 840 may include a display,audio speakers, a printing device, another processor or printed circuitboard, etc. In some embodiments, output device 840 may be a peripheralthat interfaces with device 805 via peripheral components 820 or may bemanaged by input/output controller component 825.

The components of memory controller 140-b, device 805, and memory array100-b may be made up of circuitry designed to carry out their functions.This may include various circuit elements, for example, conductivelines, transistors, capacitors, inductors, resistors, amplifiers, orother active or inactive elements, configured to carry out the functionsdescribed herein.

FIG. 9 shows a flowchart illustrating a method 900 of selection of andoperations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure. The operations of methodsand techniques discussed with reference to FIGS. 4-8, among others, maybe implemented by a memory array 100 as described with reference toFIGS. 1-8. For example, the operations of method and techniques relatingFIGS. 4-6, among others, may be performed by a memory controller 140 asdescribed with reference to FIGS. 1, 7 and 8, among others. In someembodiments, a memory controller 140 may execute a set of codes tocontrol the functional elements of the memory array 100 to perform thefunctions described below. Additionally or alternatively, the memorycontroller 140 may perform embodiments of the functions described belowusing special-purpose hardware. Additionally or alternatively, thememory controller 140 may initiate one or more signals and/orinstruction to enable one or more other components or elements toperform embodiments of the functions described below usingspecial-purpose hardware.

At block 905, the method may include identifying a first cell plateincluded in a first cell plate group, as described with reference toFIGS. 1-8, among others. In some embodiments, this identification of thefirst cell plate may be based on one or more operating characteristicsof the first cell plate, another cell plate, a combination of the firstcell plate and a second cell plate, and/or one or more other separatecell plates. For example, the operating characteristics may include avoltage, a current, a value, an electric current relationship relatingto one or more plates, a performance relationship relating to one ormore plates, an absolute location of one or more plates and/or othercomponents, a relative location of one or more plates and/or othercomponents, some combination, and/or other characteristics and/orrelationships In some embodiments, the operations of block 905 may beperformed by the memory controller 140, as described with reference toFIGS. 1, 7, and 8, among others In some embodiments, the operations ofblock 905 may be initiated by the memory controller 140, as describedwith reference to FIGS. 1, 7, and 8, among others. In other embodiments,the operations of block 905 may be performed by a different elementand/or component of a memory array and/or a memory apparatus other thanmemory controller 140.

At block 910, the method may include identifying a second cell platethat is adjacent to the first cell plate and/or included in the firstcell plate group or a second cell plate group, as described withreference to FIGS. 1-8, among others. In some embodiments, thisidentification of the second cell plate may be based on one or moreoperating characteristics of the first cell plate, another cell plate, acombination of the first cell plate and a second cell plate, and/or oneor more other separate cell plates, among other factors. For example,the operating characteristics may include a voltage, a current, a value,an electric current relationship relating to one or more plates, aperformance relationship relating to one or more plates, an absolutelocation of one or more plates and/or other components, a relativelocation of one or more plates and/or other components, somecombination, and/or other things. In some embodiments, the operations ofblock 910 may be performed by the memory controller 140, as describedwith reference to FIGS. 1, 7, and 8, among others. In some embodiments,the operations of block 910 may be initiated by the memory controller140, as described with reference to FIGS. 1, 7, and 8, among others. Inother embodiments, the operations of block 910 may be performed by adifferent element and/or component of a memory array and/or a memoryapparatus, among other things.

At block 915, the method may include selecting the first cell plate andthe second cell plate based on an electric current relationship betweenthe first cell plate and the second cell plate, as described withreference to FIGS. 1-8, among others. This selection may be performed byand/or on one or more memory elements or components, and/or be based onelectronic communication with one or more elements or components. Insome embodiments, this selection may include selecting one or moreselection components (that may in some embodiments include transistors,among other things). In some embodiments, this selection may includeselecting one or more selection component pairs that may enable sensecomponents corresponding to each digit line depending from eachselection component to be correctly populated with data. In someembodiments, the method may further include reading from one or moresense components relating to one or more selection components, plates,and/or digit lines based on the selection.

In some embodiments, one or more selections may be based on one or moretriggering events, including, but not limited to a fuse being triggeredby one or more signals and/or one or more operating parameters relatingto one or more elements or components (e.g., a cell plate and/or a sensecomponent). In some embodiments, Based at least in part on the existenceof and/or a determination of an electric current relationship In someembodiments, the operations of block 915 may be performed by the memorycontroller 140, as described with reference to FIGS. 1, 7, and 8, amongothers. In some embodiments, the operations of block 915 may beinitiated by the memory controller 140, as described with reference toFIGS. 1, 7, and 8, among others. In other embodiments, the operations ofblock 915 may be performed by a different element and/or component of amemory array and/or a memory apparatus, among other things.

FIG. 10 shows a flowchart illustrating a method 1000 of selection of andoperations relating to one or more cell plates in accordance withvarious embodiments of the present disclosure. The operations of methodsand techniques discussed with reference to FIGS. 4-9, among others, maybe implemented by a memory array 100 as described with reference toFIGS. 1-9. For example, the operations of method and techniques relatingFIGS. 4-6, among others, may be performed by a memory controller 140 asdescribed with reference to FIGS. 1, 7 and 8, among others. In someembodiments, a memory controller 140 may execute a set of codes tocontrol the functional elements of the memory array 100 to perform thefunctions described below. Additionally or alternatively, the memorycontroller 140 may perform embodiments of the functions described belowusing special-purpose hardware. Additionally or alternatively, thememory controller 140 may initiate one or more signals and/orinstruction to enable one or more other components or elements toperform embodiments of the functions described below usingspecial-purpose hardware.

At block 1005, the method may include identifying a first cell plateincluded in a first cell plate group, as described with reference toFIGS. 1-9, among others. In some embodiments, this identification of thefirst cell plate may be based on one or more operating characteristicsof the first cell plate, another cell plate, a combination of the firstcell plate and a second cell plate, and/or one or more other separatecell plates. For example, the operating characteristics may include avoltage, a current, a value, an electric current relationship relatingto one or more plates, a performance relationship relating to one ormore plates, an absolute location of one or more plates and/or othercomponents, a relative location of one or more plates and/or othercomponents, some combination, and/or other things. In some embodiments,the operations of block 1005 may be performed by the memory controller140, as described with reference to FIGS. 1, 7, and 8, among others. Insome embodiments, the operations of block 1005 may be initiated by thememory controller 140, as described with reference to FIGS. 1, 7, and 8,among others. In other embodiments, the operations of block 1005 may beperformed by a different element and/or component of a memory arrayand/or a memory apparatus, among other things.

At block 1010, the method may include identifying a second cell platethat is adjacent to the first cell plate and/or included in the firstcell plate group or a second cell plate group, as described withreference to FIGS. 1-8, among others. In some embodiments, thisidentification of the second cell plate may be based on one or moreoperating characteristics of the first cell plate, another cell plate, acombination of the first cell plate and a second cell plate, and/or oneor more other separate cell plates. For example, the operatingcharacteristics may include a voltage, a current, a value, an electriccurrent relationship relating to one or more plates, a performancerelationship relating to one or more plates, an absolute location of oneor more plates and/or other components, a relative location of one ormore plates and/or other components, some combination, and/or otherthings.

In some embodiments, the identification of a second cell plate that isadjacent to the first cell plate may be made regardless of whether thesecond cell plate is included in a particular plate group (e.g., thefirst cell plate group, the second cell plate group). In someembodiments, the identification of a second cell plate that is adjacentto the first cell plate may be made based on whether the second cellplate is included in a particular plate group itself (e.g., the firstcell plate group, the second cell plate group) and/or based on thewhether another plate (e.g., a first cell plate) is included in the sameplate group (irrespective of which particular plate group that is), adifferent plate group, a related plate group, an adjacent plate group,some combination, and/or other factors. In some embodiments, theoperations of block 1010 may be performed by the memory controller 140,as described with reference to FIGS. 1, 7, and 8, among others. In someembodiments, the operations of block 1010 may be initiated by the memorycontroller 140, as described with reference to FIGS. 1, 7, and 8, amongothers. In other embodiments, the operations of block 1010 may beperformed by a different element and/or component of a memory arrayand/or a memory apparatus, among other things.

At block 1015, the method may include identifying or determining thatthe first cell plate is included in the first cell plate group and thesecond cell plate is included in the second cell plate group, asdescribed with reference to FIGS. 1-8, among others. This identificationand/or determination may be performed by and/or on one or more memoryelements or components, and/or be based on electronic communication withone or more elements or components. In some embodiments, thisidentification and/or determination may include identifying ordetermining a location and/or a spatial relationship between the firstcell plate and the second cell plate. This identifying or determining ofa location and/or a spatial relationship, among other things, may bebased on determining or identifying whether the second cell plate islocated in the same cell plate group as the first cell plate.

Additionally or alternatively, this identifying or determining of alocation and/or a spatial relationship, among other things, may be basedon determining whether the second cell plate is adjacent to the firstcell plate in the first cell plate group. This identifying ordetermining of a location and/or a spatial relationship, among otherthings, may be based on determining or identifying whether the firstcell plate and the second cell plate are located within absolute and/orrelative respective positions within a first cell plate group and/or asecond cell plate group. This identifying or determining of a locationand/or a spatial relationship, among other things, may be based ondetermining or identifying whether the first cell plate and the secondcell plate are located relative to a plate pair that is related toand/or includes an electric current relationship, which plate pair mayor may not include the first cell plate and/or the second cell plate.

In some embodiments, the operations of block 1015 may be performed bythe memory controller 140, as described with reference to FIGS. 1, 7,and 8, among others. In some embodiments, the operations of block 1015may be initiated by the memory controller 140, as described withreference to FIGS. 1, 7, and 8, among others. In other embodiments, theoperations of block 1015 may be performed by a different element and/orcomponent of a memory array and/or a memory apparatus, among otherthings.

At block 1020, the method may include identifying or determining thatthe first cell plate is in a last position in the first cell plate groupand the second cell plate is in a first position in the second cellplate group, as described with reference to FIGS. 1-8, among others.This identification and/or determination may be performed by and/or onone or more memory elements or components, and/or be based on electroniccommunication with one or more elements or components. In someembodiments, this identification and/or determination may includeidentifying or determining a location of each of and/or a spatialrelationship between the first cell plate and the second cell plate.This identifying or determining of a location and/or a spatialrelationship, among other things, may be based on determining oridentifying whether the second cell plate is adjacent to (among otherrelationships) the first cell plate, but with each of these positionedin separate cell plate groups. This identifying or determining may bebased on one or more other identifying, determining, and/or selectingsteps, among other things.

This identifying or determining of a location and/or a spatialrelationship, among other things, may be based on determining oridentifying whether the first cell plate and the second cell plate arelocated within absolute and/or relative respective positions within afirst cell plate group and/or a second cell plate group. For example,this identifying or determining may be based on determining whether thefirst cell plate is in a first position and/or an initial position(e.g., position “0”) in the first cell plate group. This identifying ordetermining may be based on the identifying and/or the determiningrelating to the first cell plate and may be based on determining whetherthe second cell plate is in a first position and/or an initial position(e.g., position “0”), in an intermediate initial position (e.g.,position “1” through position “6), and/or in a last and/or a final(e.g., position “7”) in the second (or another) cell plate group. Thisidentifying or determining of a location and/or a spatial relationship,among other things, may be based on determining or identifying whetherthe first cell plate and the second cell plate are located relative to aplate pair that is related to and/or includes an electric currentrelationship, In some embodiments, this plate pair may or may notinclude the first cell plate and/or the second cell plate.

In some embodiments, the operations of block 1020 may be performed bythe memory controller 140, as described with reference to FIGS. 1, 7,and 8, among others. In some embodiments, the operations of block 1020may be initiated by the memory controller 140, as described withreference to FIGS. 1, 7, and 8, among others. In other embodiments, theoperations of block 1020 may be performed by a different element and/orcomponent of a memory array and/or a memory apparatus, among otherthings.

At block 1025, the method may include selecting the first cell plate andthe second cell plate based on a short between two cell plates, asdescribed with reference to FIGS. 1-8, among others. This selection maybe performed by and/or on one or more memory elements or components,and/or be based on electronic communication with one or more elements orcomponents. In some embodiments, this selection may include selectingone or more selection components (that may in some embodiments includetransistors, among other things). In some embodiments, this selectionmay include selecting one or more selection component pair that mayenable sense components corresponding to each digit line depending fromeach selection component to be correctly populated with data. In someembodiments, the method may further include reading from one or moresense components relating to one or more selection components, plates,and/or digit lines based on the selection.

In some embodiments, one or more selections may be based on a triggeringevent, including, but not limited to a fuse being triggered by one ormore signals and/or one or more operating parameters relating to one ormore elements or components (e.g., a cell plate and/or a sensecomponent). In some embodiments, based on the existence of and/or adetermination of an adverse flow of electrons directly between two cellplates (e.g., a short). In some embodiments, the operations of block1025 may be performed by the memory controller 140, as described withreference to FIGS. 1, 7, and 8, among others. In some embodiments, theoperations of block 1025 may be initiated by the memory controller 140,as described with reference to FIGS. 1, 7, and 8, among others. In otherembodiments, the operations of block 1025 may be performed by adifferent element and/or component of a memory array and/or a memoryapparatus, among other things.

Thus, methods 900, 1000, and the others described throughout andcontemplated by the present disclosure may provide for selection of andoperations relating to cell plates using one or more elements orcomponents. It should be noted that methods 900, 1000, and the othersdescribed throughout and contemplated by the present disclosure describepossible implementations, and the operations and steps may berearranged, omitted, modified, supplemented, or otherwise modified suchthat other implementations are possible and contemplated. In someembodiments, embodiments from two or more of the methods 900, 1000, andthe others described throughout and contemplated by the presentdisclosure may be combined.

The description herein provides embodiments, and is not limiting of thescope, applicability, or embodiments set forth in the claims. Changesmay be made in the function and arrangement of elements discussedwithout departing from the scope of the disclosure. Various embodimentsmay omit, substitute, or add various procedures or components asappropriate. Also, features described with respect to some embodimentsmay be combined in other embodiments.

The description set forth herein, in connection with the appendeddrawings, describes example configurations and does not represent allthe embodiments that may be implemented or that are within the scope ofthe claims. The terms “example” and “exemplary,” as used herein, mean“serving as an example, instance, or illustration,” and not “preferred”or “advantageous over other embodiments.” The detailed descriptionincludes specific details for the purpose of providing an understandingof the described techniques. These techniques, however, may be practicedwithout these specific details. In some instances, well-known structuresand devices are shown in block diagram form in order to avoid obscuringthe concepts of the described embodiments.

In the appended figures, similar components or features may have thesame reference label. Further, various components of the same type maybe distinguished by following the reference label by a dash and a secondlabel that distinguishes among the similar components. When the firstreference label is used in the specification, the description isapplicable to any one of the similar components having the same firstreference label irrespective of the second reference label.

Information and signals described herein may be represented using any ofa variety of different technologies and techniques. For example, data,instructions, commands, information, signals, bits, symbols, and chipsthat may be referenced throughout the above description may berepresented by voltages, currents, electromagnetic waves, magneticfields or particles, optical fields or particles, or any combinationthereof. Some drawings may illustrate signals as a single signal;however, it will be understood by a person of ordinary skill in the artthat the signal may represent a bus of signals, where the bus may have avariety of bit widths.

As used herein, the term “virtual ground” refers to a node of anelectrical circuit that is held at a voltage of approximately zero volts(0V) but that is not directly connected with ground. Accordingly, thevoltage of a virtual ground may temporarily fluctuate and return toapproximately 0V at steady state. A virtual ground may be implementedusing various electronic circuit elements, such as a voltage dividerconsisting of operational amplifiers and resistors. Otherimplementations are also possible.

The term “electronic communication” refers to a relationship betweencomponents that supports electron flow between the components. This mayinclude a direct connection between components and/or may includeintermediate components. Components in electronic communication may beactively exchanging elections or signals (e.g., in an energized circuit)or may not be actively exchanging electrons or signals (e.g., in ade-energized circuit) but may be configured and operable to exchangeelectrons or signals upon a circuit being energized. By way of example,two components physically connected via a switch (e.g., a transistor)are in electronic communication regardless of the state of the switch(i.e., open or closed).

The devices discussed herein, including memory array 100, may be formedon a semiconductor substrate, such as silicon, germanium,silicon-germanium alloy, gallium arsenide, gallium nitride, etc. In someembodiments, the substrate is a semiconductor wafer. In otherembodiments, the substrate may be a silicon-on-insulator (SOI)substrate, such as silicon-on-glass (SOG) or silicon-on-sapphire (SOP),or epitaxial layers of semiconductor materials on another substrate. Theconductivity of the substrate, or sub-regions of the substrate, may becontrolled through doping using various chemical species including, butnot limited to, phosphorous, boron, or arsenic. Doping may be performedduring the initial formation or growth of the substrate, byion-implantation, or by any other doping means.

Transistors discussed herein may represent a field-effect transistor(FET) and comprise a three terminal device including a source, drain,and gate. The terminals may be connected to other electronic elementsthrough conductive materials, e.g., metals. The source and drain may beconductive and may comprise a heavily-doped, e.g., degenerate,semiconductor region. The source and drain may be separated by alightly-doped semiconductor region or channel. If the channel is n-type(i.e., majority carriers are electrons), then the FET may be referred toas a n-type FET. Likewise, if the channel is p-type (i.e., majoritycarriers are holes), then the FET may be referred to as a p-type FET.The channel may be capped by an insulating gate oxide. The channelconductivity may be controlled by applying a voltage to the gate. Forexample, applying a positive voltage or negative voltage to an n-typeFET or a p-type FET, respectively, may result in the channel becomingconductive. A transistor may be “on” or “activated” when a voltagegreater than or equal to the transistor's threshold voltage is appliedto the transistor gate. The transistor may be “off” or “deactivated”when a voltage less than the transistor's threshold voltage is appliedto the transistor gate.

The various illustrative blocks, components, and modules described inconnection with the disclosure herein may be implemented or performedwith a general-purpose processor, a DSP, an ASIC, an FPGA or otherprogrammable logic device, discrete gate or transistor logic, discretehardware components, or any combination thereof designed to perform thefunctions described herein. A general-purpose processor may be amicroprocessor, but in the alternative, the processor may be anyconventional processor, controller, microcontroller, or state machine. Aprocessor may also be implemented as a combination of computing devices(e.g., a combination of a DSP and a microprocessor, multiplemicroprocessors, one or more microprocessors in conjunction with a DSPcore, or any other such configuration).

The functions described herein may be implemented in hardware, softwareexecuted by a processor, firmware, or any combination thereof. Ifimplemented in software executed by a processor, the functions may bestored on or transmitted over as one or more instructions or code on acomputer-readable medium. Other embodiments and implementations arewithin the scope of the disclosure and appended claims. For example, dueto the nature of software, functions described above may be implementedusing software executed by a processor, hardware, firmware, hardwiring,or combinations of any of these. Features implementing functions mayalso be physically located at various positions, including beingdistributed such that portions of functions are implemented at differentphysical locations. Also, as used herein, including in the claims, “or”as used in a list of items (for example, a list of items prefaced by aphrase such as “at least one of” or “one or more of”) indicates aninclusive list such that, for example, a list of at least one of A, B,or C means A or B or C or AB or AC or BC or ABC (i.e., A and B and C).

Computer-readable media includes both non-transitory computer storagemedia and communication media including any medium that facilitatestransfer of a computer program from one place to another. Anon-transitory storage medium may be any available medium that may beaccessed by a general purpose or special purpose computer. By way ofexample, and not limitation, non-transitory computer-readable media maycomprise RAM, ROM, electrically erasable programmable read only memory(EEPROM), compact disk (CD) ROM or other optical disk storage, magneticdisk storage or other magnetic storage devices, or any othernon-transitory medium that may be used to carry or store desired programcode means in the form of instructions or data structures and that maybe accessed by a general-purpose or special-purpose computer, or ageneral-purpose or special-purpose processor.

Also, any connection is properly termed a computer-readable medium. Forexample, if the software is transmitted from a website, server, or otherremote source using a coaxial cable, fiber optic cable, twisted pair,digital subscriber line (DSL), or wireless technologies such asinfrared, radio, and microwave, then the coaxial cable, fiber opticcable, twisted pair, digital subscriber line (DSL), or wirelesstechnologies such as infrared, radio, and microwave are included in thedefinition of medium. Disk and disc, as used herein, include CD, laserdisc, optical disc, digital versatile disc (DVD), floppy disk andBlu-ray disc where disks usually reproduce data magnetically, whilediscs reproduce data optically with lasers. Combinations of the aboveare also included within the scope of computer-readable media.

The description herein is provided to enable a person skilled in the artto make or use the disclosure. Various modifications to the disclosurewill be readily apparent to those skilled in the art, and the genericprinciples defined herein may be applied to other variations withoutdeparting from the scope of the disclosure. Thus, the disclosure is notto be limited to the embodiments and designs described herein but is tobe accorded the broadest scope consistent with the principles and novelfeatures disclosed herein.

1. (canceled)
 2. A method, comprising: identifying a first cell platecoupled with a first access line and a second cell plate coupled with asecond access line, the first cell plate and the second cell plate beingin a same cell plate group comprising a plurality of sequential cellplates, wherein the first cell plate is located in a first position ofthe cell plate group and the second cell plate is located in a secondposition in the cell plate group; determining that a magnitude of acurrent between the first cell plate and the second cell plate exceeds athreshold; and activating a first selection component coupled with thefirst access line and a second selection component coupled with thesecond access line based at least in part on the magnitude of thecurrent between the first cell plate and the second cell plate exceedingthe threshold.
 3. The method of claim 2, further comprising: determininga spatial relationship between the first cell plate and the second cellplate, wherein determining that the magnitude of the current between thefirst cell plate and the second cell plate exceeds the threshold isbased at least in part on the spatial relationship.
 4. The method ofclaim 3, wherein activating the first selection component coupled withthe first access line and the second selection component coupled withthe second access line is based at least in part on determining thespatial relationship between the first cell plate and the second cellplate.
 5. The method of claim 2, wherein activating the first selectioncomponent and the second selection component comprises grouping thefirst cell plate and the second cell plate into a cell plate pair. 6.The method of claim 2, wherein the cell plate group comprises anadditional cell plate preceding the first cell plate in the sequentialcell plates, and an additional cell plate subsequent to the second cellplate in the sequential cell plates.
 7. The method of claim 2, whereinthe current between the first cell plate and the second cell platecomprises an electrical short between the first cell plate and thesecond cell plate.
 8. The method of claim 2, further comprising:identifying that a fuse is triggered based at least in part on thecurrent between the first cell plate and the second cell plate exceedingthe threshold, wherein activating the first selection component coupledwith the first access line and the second selection component coupledwith the second access line is based at least in part on the fuse beingtriggered.
 9. The method of claim 2, further comprising: identifying athird cell plate coupled with a third access line and a fourth cellplate coupled with a fourth access line, the third cell plate and thefourth cell plate being in the cell plate group; determining a magnitudeof a current between the third cell plate and the fourth cell plate; andactivating a third selection component coupled with the third accessline and a fourth selection component coupled with the fourth accessline based at least in part on the magnitude of the current between thethird cell plate and the fourth cell plate exceeding the threshold. 10.The method of claim 2, further comprising: accessing a ferroelectricmemory cell associated with the first cell plate, the second cell plate,or both after activating the first selection component.
 11. Anapparatus, comprising: a cell plate group comprising a plurality ofsequential cell plates including a first cell plate in a first positionand a second cell plate in a second position; a first access linecoupled with the first cell plate; a second access line coupled with thesecond cell plate; and a first pair of selection components coupled withthe first access line and the second access line, wherein the first pairof selection components is configured to be activated based at least inpart on a magnitude of a current between the first cell plate and thesecond cell plate exceeding a threshold.
 12. The apparatus of claim 11,wherein the cell plate group comprises an additional cell platepreceding the first cell plate in the sequential cell plates, and anadditional cell plate subsequent to the second cell plate in thesequential cell plates, wherein the current between the first cell plateand the second cell plate is based at least in part on a spatialrelationship between the first cell plate and the second cell plate. 13.The apparatus of claim 11, further comprising: a fuse coupled with thefirst pair of selection components, wherein the fuse is configured to betriggered based at least in part on the magnitude of the current betweenthe first cell plate and the second cell plate.
 14. The apparatus ofclaim 11, further comprising: a plurality of first access lines coupledwith the first cell plate, wherein each of the plurality of first accesslines is coupled with a first transistor; and a plurality of secondaccess lines coupled with the second cell plate, wherein each of theplurality of second access lines is coupled with a second transistor.15. The apparatus of claim 14, wherein a voltage applied to at least oneof the plurality of first access lines is configured to activate atleast one transistor coupled with the plurality of first access lines,and the voltage applied to at least one of the plurality of secondaccess lines is configured to activate at least one transistor coupledwith the plurality of second access lines based at least in part on themagnitude of the current between the first cell plate and the secondcell plate exceeding the threshold.
 16. The apparatus of claim 11,further comprising: a third cell plate in a third position of the cellplate group and a fourth cell plate in a fourth position of the cellplate group; a third access line coupled with the third cell plate; afourth access line coupled with the fourth cell plate; and a second pairof selection components coupled with the third access line and thefourth access line, wherein a voltage applied to the third access lineis configured to activate a first selection component of the second pairof selection components, and the voltage applied to the fourth accessline is configured to activate a second selection component of thesecond pair of selection components based at least in part on amagnitude of a current between the third cell plate and the fourth cellplate exceeding the threshold.
 17. The apparatus of claim 11, furthercomprising: a first ferroelectric memory cell coupled with the firstcell plate and a second ferroelectric memory cell coupled with thesecond cell plate, wherein the first ferroelectric memory cell, thesecond ferroelectric memory cell, or both are accessed after the firstpair of selection components is activated.
 18. An apparatus, comprising:a cell plate group comprising a plurality of sequential cell platesincluding a first cell plate and a second cell plate; a first accessline coupled with the first cell plate; a second access line coupledwith the second cell plate; and a first pair of selection componentscoupled with the first access line and the second access line; and amemory controller coupled with the cell plate group, wherein the memorycontroller is operable to: identify the first cell plate coupled withthe first access line and the second cell plate coupled with the secondaccess line; determine that a magnitude of a current between the firstcell plate and the second cell plate exceeds a threshold; and activatethe first pair of selection components based at least in part on themagnitude of the current between the first cell plate and the secondcell plate exceeding a threshold.
 19. The apparatus of claim 18, whereinthe memory controller is operable to: identify that a fuse is triggeredbased at least in part on the current between the first cell plate andthe second cell plate exceeding the threshold, wherein the memorycontroller is configured to activate the first pair of selectioncomponents based at least in part on the fuse being triggered.
 20. Theapparatus of claim 18, wherein the memory controller is operable to:determine a location of the current relative to the first cell plate andthe second cell plate, wherein the memory controller is configured toactivate the first pair of selection components based at least in partthe location of the current.
 21. The apparatus of claim 18, wherein thememory controller is operable to determine the magnitude of the currentbetween the first cell plate and the second cell plate based at least inpart on a spatial relationship between the first cell plate and thesecond cell plate.